高k间隔层对非均匀掺杂DG-MOSFET性能的影响

S. Swain, S. K. Das, S. Biswal, Sarosij Adak, U. Nanda, Asmit Amlan Sahoo, Debasish Navak, Biswajit Baral, Dhananjaya Tripathy
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引用次数: 11

摘要

本文研究了不同间隔段变化的非均匀掺杂双栅MOSFET的性能,分析了短通道和各种性能指标对其性能的影响。本研究以硅为通道材料,掺杂不均匀,研究模拟和射频性能。采用不同介电常数的间隔材料,了解其对器件性能的影响。仿真结果表明,加入间隔层后,器件的模拟性能和射频性能均有显著提高。我们使用了SILVACO International的计算机辅助设计(TCAD)模拟。
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Effect of High-K Spacer on the Performance of Non-Uniformly doped DG-MOSFET
This paper presents the performance of non-uniformed doped double gate (DG) MOSFET with different spacer variations with an aim to analysis the effects of short channel and various performance metrics. In this work we have taken silicon as the channel material with non-uniform doping for studying the analog and RF performances. Spacer's materials having different permittivities were used to understand their effect on the device performance. Based on the simulations, we can conclude that analog and Radio Frequency performance of the device shows an significant improvement with addition of spacer layer. We have used computer aided design (TCAD) simulations by SILVACO International.
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