升级我的ATE还是不升级

J. Lagrotta, D. Lowenstein
{"title":"升级我的ATE还是不升级","authors":"J. Lagrotta, D. Lowenstein","doi":"10.1109/AUTEST.2009.5314041","DOIUrl":null,"url":null,"abstract":"In electronics today one thing stays constant, change. It seems that every day somebody is pushing the limits of what to expect next out of the phone we talk on, the computer we use to do our day job, the equipment our soldier are protecting us with. As electronic system technology becomes more complex, it becomes more difficult to assure customer satisfaction. Carefully planned instrumentation migration and modernization can maximize test-system efficiency, performance and quality—and provide meaningful cost savings. There are certainly risks associated with test program set (TPS) migration and modernization. The decision to forego modernization also carries a variety of risks. Ultimately, the decision to refresh outdated technology can provide meaningful cost reductions in areas such as the number of test sets, system throughput, and calibration, maintenance and repair. This paper will explore ways you can mitigate the risks of migration by applying proven success factors.","PeriodicalId":187421,"journal":{"name":"2009 IEEE AUTOTESTCON","volume":"26 2 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2009-11-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"To upgrade my ATE or not to upgrade\",\"authors\":\"J. Lagrotta, D. Lowenstein\",\"doi\":\"10.1109/AUTEST.2009.5314041\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In electronics today one thing stays constant, change. It seems that every day somebody is pushing the limits of what to expect next out of the phone we talk on, the computer we use to do our day job, the equipment our soldier are protecting us with. As electronic system technology becomes more complex, it becomes more difficult to assure customer satisfaction. Carefully planned instrumentation migration and modernization can maximize test-system efficiency, performance and quality—and provide meaningful cost savings. There are certainly risks associated with test program set (TPS) migration and modernization. The decision to forego modernization also carries a variety of risks. Ultimately, the decision to refresh outdated technology can provide meaningful cost reductions in areas such as the number of test sets, system throughput, and calibration, maintenance and repair. This paper will explore ways you can mitigate the risks of migration by applying proven success factors.\",\"PeriodicalId\":187421,\"journal\":{\"name\":\"2009 IEEE AUTOTESTCON\",\"volume\":\"26 2 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2009-11-06\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2009 IEEE AUTOTESTCON\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/AUTEST.2009.5314041\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2009 IEEE AUTOTESTCON","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/AUTEST.2009.5314041","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

摘要

在今天的电子行业,有一样东西是不变的,那就是变化。似乎每天都有人在挑战我们对手机、日常工作用的电脑、士兵用来保护我们的装备的极限。随着电子系统技术的日益复杂,保证客户满意的难度也越来越大。精心计划的仪器迁移和现代化可以最大化测试系统的效率、性能和质量,并提供有意义的成本节约。当然存在与测试程序集(TPS)迁移和现代化相关的风险。放弃现代化的决定也带来了各种风险。最终,更新过时技术的决定可以在测试设备数量、系统吞吐量、校准、维护和维修等方面提供有意义的成本降低。本文将探索通过应用已证实的成功因素来降低迁移风险的方法。
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To upgrade my ATE or not to upgrade
In electronics today one thing stays constant, change. It seems that every day somebody is pushing the limits of what to expect next out of the phone we talk on, the computer we use to do our day job, the equipment our soldier are protecting us with. As electronic system technology becomes more complex, it becomes more difficult to assure customer satisfaction. Carefully planned instrumentation migration and modernization can maximize test-system efficiency, performance and quality—and provide meaningful cost savings. There are certainly risks associated with test program set (TPS) migration and modernization. The decision to forego modernization also carries a variety of risks. Ultimately, the decision to refresh outdated technology can provide meaningful cost reductions in areas such as the number of test sets, system throughput, and calibration, maintenance and repair. This paper will explore ways you can mitigate the risks of migration by applying proven success factors.
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