Mohamed K. M. Fadul, Donald R. Reising, Lakmali P. Weerasena
{"title":"研究基于深度学习的重采样对特定发射器识别性能的影响","authors":"Mohamed K. M. Fadul, Donald R. Reising, Lakmali P. Weerasena","doi":"10.1049/tje2.12327","DOIUrl":null,"url":null,"abstract":"Abstract Increasing Internet of Things (IoT) deployments present a growing surface over which villainous actors can carry out attacks. This disturbing revelation is amplified by the fact that most IoT devices use weak or no encryption. Specific Emitter Identification (SEI) is an approach intended to address this IoT security weakness. This work provides the first Deep Learning (DL) driven SEI approach that upsamples the signals after collection to improve performance while reducing the hardware requirements of the IoT devices that collect them. DL‐driven upsampling results in superior SEI performance versus two traditional upsampling approaches and a convolutional neural network‐only approach.","PeriodicalId":22858,"journal":{"name":"The Journal of Engineering","volume":"12 11","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2023-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"An investigation into the impacts of deep learning‐based re‐sampling on specific emitter identification performance\",\"authors\":\"Mohamed K. M. Fadul, Donald R. Reising, Lakmali P. Weerasena\",\"doi\":\"10.1049/tje2.12327\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Abstract Increasing Internet of Things (IoT) deployments present a growing surface over which villainous actors can carry out attacks. This disturbing revelation is amplified by the fact that most IoT devices use weak or no encryption. Specific Emitter Identification (SEI) is an approach intended to address this IoT security weakness. This work provides the first Deep Learning (DL) driven SEI approach that upsamples the signals after collection to improve performance while reducing the hardware requirements of the IoT devices that collect them. DL‐driven upsampling results in superior SEI performance versus two traditional upsampling approaches and a convolutional neural network‐only approach.\",\"PeriodicalId\":22858,\"journal\":{\"name\":\"The Journal of Engineering\",\"volume\":\"12 11\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2023-11-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"The Journal of Engineering\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1049/tje2.12327\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"The Journal of Engineering","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1049/tje2.12327","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
An investigation into the impacts of deep learning‐based re‐sampling on specific emitter identification performance
Abstract Increasing Internet of Things (IoT) deployments present a growing surface over which villainous actors can carry out attacks. This disturbing revelation is amplified by the fact that most IoT devices use weak or no encryption. Specific Emitter Identification (SEI) is an approach intended to address this IoT security weakness. This work provides the first Deep Learning (DL) driven SEI approach that upsamples the signals after collection to improve performance while reducing the hardware requirements of the IoT devices that collect them. DL‐driven upsampling results in superior SEI performance versus two traditional upsampling approaches and a convolutional neural network‐only approach.