ITZO薄膜晶体管迁移率增强研究进展

IF 4.8 4区 物理与天体物理 Q2 PHYSICS, CONDENSED MATTER Journal of Semiconductors Pub Date : 2023-09-01 DOI:10.1088/1674-4926/44/9/091602
Feilian Chen, Meng Zhang, Yunhao Wan, Xindi Xu, Man Wong, Hoi-Sing Kwok
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引用次数: 1

摘要

铟锡锌氧化物(ITZO)薄膜晶体管(TFT)技术有望实现高迁移率,并为商业化提供了重要机会。本文综述了近年来在提高ITZO tft流动性方面的研究进展。本文首先介绍了金属氧化物TFT的发展和现状,然后解释了选择ITZO作为TFT通道层的优点。随后介绍了TFTs的评价标准,阐明了提高流动性的原因和意义。从有源层优化、栅极介电介质优化、电极优化、界面优化和器件结构优化五个方面探讨了高迁移率ITZO tft的发展。最后,对研究领域进行了总结和展望。
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Advances in mobility enhancement of ITZO thin-film transistors: a review
Abstract Indium-tin-zinc oxide (ITZO) thin-film transistor (TFT) technology holds promise for achieving high mobility and offers significant opportunities for commercialization. This paper provides a review of progress made in improving the mobility of ITZO TFTs. This paper begins by describing the development and current status of metal-oxide TFTs, and then goes on to explain the advantages of selecting ITZO as the TFT channel layer. The evaluation criteria for TFTs are subsequently introduced, and the reasons and significance of enhancing mobility are clarified. This paper then explores the development of high-mobility ITZO TFTs from five perspectives: active layer optimization, gate dielectric optimization, electrode optimization, interface optimization, and device structure optimization. Finally, a summary and outlook of the research field are presented.
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来源期刊
Journal of Semiconductors
Journal of Semiconductors PHYSICS, CONDENSED MATTER-
CiteScore
6.70
自引率
9.80%
发文量
119
期刊介绍: Journal of Semiconductors publishes articles that emphasize semiconductor physics, materials, devices, circuits, and related technology.
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