{"title":"基于电压转换特性判定点的管道模数转换器数字背景校正技术","authors":"Kourosh Ghanbari, Ebrahim Farshidi, Navid Alaei Sheini","doi":"10.1007/s10470-023-02196-2","DOIUrl":null,"url":null,"abstract":"<div><p>A new technique is introduced for digital background calibration in pipeline analog to digital converters (ADCs). The technique is based on the decision points of the voltage transfer characteristic (VTC) of the pipeline stages, which means the residual VTC is used to estimate the output code of the decision points. By applying the proposed technique, the capacitor mismatch error, the residual amplifier error, and the nonlinearity errors are corrected. To attain proper decision points, the sub-ADC is considered and one of its threshold levels is changed. The mathematical relations of the errors are extracted, and then by applying error coefficients to the final digital outputs, the pipeline ACD is calibrated. This method has a simple digital logic and does not require a particular analog circuit. The proposed technique is applied to the first five stages of a 12-bit 100 MS/s pipeline ADC, and about 0.7 × 10<sup>6</sup> samples are used. The results show that the presented technique improves the signal-to-noise and distortion ratio (SNDR) and spurious-free dynamic range (SFDR) from 34.1 and 35.1 dB to 69.2 and 77.6 dB, respectively.</p></div>","PeriodicalId":7827,"journal":{"name":"Analog Integrated Circuits and Signal Processing","volume":null,"pages":null},"PeriodicalIF":1.2000,"publicationDate":"2023-11-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"A new digital background calibration technique for pipeline analog to digital converters using decision points of the voltage transfer characteristics\",\"authors\":\"Kourosh Ghanbari, Ebrahim Farshidi, Navid Alaei Sheini\",\"doi\":\"10.1007/s10470-023-02196-2\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<div><p>A new technique is introduced for digital background calibration in pipeline analog to digital converters (ADCs). The technique is based on the decision points of the voltage transfer characteristic (VTC) of the pipeline stages, which means the residual VTC is used to estimate the output code of the decision points. By applying the proposed technique, the capacitor mismatch error, the residual amplifier error, and the nonlinearity errors are corrected. To attain proper decision points, the sub-ADC is considered and one of its threshold levels is changed. The mathematical relations of the errors are extracted, and then by applying error coefficients to the final digital outputs, the pipeline ACD is calibrated. This method has a simple digital logic and does not require a particular analog circuit. The proposed technique is applied to the first five stages of a 12-bit 100 MS/s pipeline ADC, and about 0.7 × 10<sup>6</sup> samples are used. The results show that the presented technique improves the signal-to-noise and distortion ratio (SNDR) and spurious-free dynamic range (SFDR) from 34.1 and 35.1 dB to 69.2 and 77.6 dB, respectively.</p></div>\",\"PeriodicalId\":7827,\"journal\":{\"name\":\"Analog Integrated Circuits and Signal Processing\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":1.2000,\"publicationDate\":\"2023-11-22\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Analog Integrated Circuits and Signal Processing\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://link.springer.com/article/10.1007/s10470-023-02196-2\",\"RegionNum\":4,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q4\",\"JCRName\":\"COMPUTER SCIENCE, HARDWARE & ARCHITECTURE\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Analog Integrated Circuits and Signal Processing","FirstCategoryId":"5","ListUrlMain":"https://link.springer.com/article/10.1007/s10470-023-02196-2","RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q4","JCRName":"COMPUTER SCIENCE, HARDWARE & ARCHITECTURE","Score":null,"Total":0}
A new digital background calibration technique for pipeline analog to digital converters using decision points of the voltage transfer characteristics
A new technique is introduced for digital background calibration in pipeline analog to digital converters (ADCs). The technique is based on the decision points of the voltage transfer characteristic (VTC) of the pipeline stages, which means the residual VTC is used to estimate the output code of the decision points. By applying the proposed technique, the capacitor mismatch error, the residual amplifier error, and the nonlinearity errors are corrected. To attain proper decision points, the sub-ADC is considered and one of its threshold levels is changed. The mathematical relations of the errors are extracted, and then by applying error coefficients to the final digital outputs, the pipeline ACD is calibrated. This method has a simple digital logic and does not require a particular analog circuit. The proposed technique is applied to the first five stages of a 12-bit 100 MS/s pipeline ADC, and about 0.7 × 106 samples are used. The results show that the presented technique improves the signal-to-noise and distortion ratio (SNDR) and spurious-free dynamic range (SFDR) from 34.1 and 35.1 dB to 69.2 and 77.6 dB, respectively.
期刊介绍:
Analog Integrated Circuits and Signal Processing is an archival peer reviewed journal dedicated to the design and application of analog, radio frequency (RF), and mixed signal integrated circuits (ICs) as well as signal processing circuits and systems. It features both new research results and tutorial views and reflects the large volume of cutting-edge research activity in the worldwide field today.
A partial list of topics includes analog and mixed signal interface circuits and systems; analog and RFIC design; data converters; active-RC, switched-capacitor, and continuous-time integrated filters; mixed analog/digital VLSI systems; wireless radio transceivers; clock and data recovery circuits; and high speed optoelectronic circuits and systems.