展望:基于量子传感器的纳米级电传感与成像

Shichen Zhang, Ke Bian, Ying Jiang
{"title":"展望:基于量子传感器的纳米级电传感与成像","authors":"Shichen Zhang, Ke Bian, Ying Jiang","doi":"10.1007/s44214-023-00045-x","DOIUrl":null,"url":null,"abstract":"<p>There is a rich of electric phenomena ubiquitously existing in novel quantum materials and advanced electronic devices. Microscopic understanding of the underlying physics relies on the sensitive and quantitative measurements of the electric field, electric current, electric potential, and other related physical quantities with a spatial resolution down to nanometers. Combined with a scanning probe microscope (SPM), the emergent quantum sensors of atomic/nanometer size provide promising platforms for imaging various electric parameters with a sensitivity beyond a single electron/charge. In this perspective, we introduce the working principle of such newly developed technologies, which are based on the strong sensitivity of quantum systems to external disturbances. Then we review the recent applications of those quantum sensors in nanoscale electric sensing and imaging, including a discussion of their privileges over conventional SPM techniques. Finally, we propose some promising directions for the future developments and optimizations of quantum sensors in nanoscale electric sensing and imaging.</p>","PeriodicalId":501227,"journal":{"name":"Quantum Frontiers","volume":"338 1","pages":""},"PeriodicalIF":0.0000,"publicationDate":"2023-11-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Perspective: nanoscale electric sensing and imaging based on quantum sensors\",\"authors\":\"Shichen Zhang, Ke Bian, Ying Jiang\",\"doi\":\"10.1007/s44214-023-00045-x\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<p>There is a rich of electric phenomena ubiquitously existing in novel quantum materials and advanced electronic devices. Microscopic understanding of the underlying physics relies on the sensitive and quantitative measurements of the electric field, electric current, electric potential, and other related physical quantities with a spatial resolution down to nanometers. Combined with a scanning probe microscope (SPM), the emergent quantum sensors of atomic/nanometer size provide promising platforms for imaging various electric parameters with a sensitivity beyond a single electron/charge. In this perspective, we introduce the working principle of such newly developed technologies, which are based on the strong sensitivity of quantum systems to external disturbances. Then we review the recent applications of those quantum sensors in nanoscale electric sensing and imaging, including a discussion of their privileges over conventional SPM techniques. Finally, we propose some promising directions for the future developments and optimizations of quantum sensors in nanoscale electric sensing and imaging.</p>\",\"PeriodicalId\":501227,\"journal\":{\"name\":\"Quantum Frontiers\",\"volume\":\"338 1\",\"pages\":\"\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2023-11-29\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Quantum Frontiers\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1007/s44214-023-00045-x\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Quantum Frontiers","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1007/s44214-023-00045-x","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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摘要

在新型量子材料和先进的电子器件中,普遍存在着丰富的电现象。对潜在物理的微观理解依赖于电场、电流、电势和其他相关物理量的敏感和定量测量,其空间分辨率低至纳米。与扫描探针显微镜(SPM)相结合,新兴的原子/纳米尺寸的量子传感器为成像各种电参数提供了有前途的平台,其灵敏度超过单个电子/电荷。从这个角度来看,我们介绍了这种基于量子系统对外部扰动的强灵敏度的新技术的工作原理。然后,我们回顾了这些量子传感器在纳米级电传感和成像中的最新应用,包括讨论了它们相对于传统SPM技术的优势。最后,我们对量子传感器在纳米尺度电传感和成像领域的未来发展和优化提出了一些有希望的方向。
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Perspective: nanoscale electric sensing and imaging based on quantum sensors

There is a rich of electric phenomena ubiquitously existing in novel quantum materials and advanced electronic devices. Microscopic understanding of the underlying physics relies on the sensitive and quantitative measurements of the electric field, electric current, electric potential, and other related physical quantities with a spatial resolution down to nanometers. Combined with a scanning probe microscope (SPM), the emergent quantum sensors of atomic/nanometer size provide promising platforms for imaging various electric parameters with a sensitivity beyond a single electron/charge. In this perspective, we introduce the working principle of such newly developed technologies, which are based on the strong sensitivity of quantum systems to external disturbances. Then we review the recent applications of those quantum sensors in nanoscale electric sensing and imaging, including a discussion of their privileges over conventional SPM techniques. Finally, we propose some promising directions for the future developments and optimizations of quantum sensors in nanoscale electric sensing and imaging.

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