陶瓷界面的高分辨率电子显微镜。

Y Ishida, S Hagege, H Ichinose, Y Takahashi
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引用次数: 7

摘要

这里所描述的三个观察结果不仅代表了我们最近在陶瓷中的界面研究,而且还展示了界面研究的现状与高分辨率电子显微镜水平的不同。在陶瓷界面研究的问题中可以发现一些共同的特征。例如,基面晶界的重要性是这类非均相化合物的特征之一。由于晶体非均质性主要是针对立方金属而发展起来的,因此在晶界结构的研究中,晶体非均质性在很大程度上被忽略了。基性晶界界面结构的研究开辟了一个新的领域,对这类界面的描述具有重要的工程意义。
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High-resolution electron microscopy of ceramic interfaces.

Three observations described here were chosen not only to represent our recent interface studies in ceramics, but also to demonstrate how different the present status of interface research is with respect to the level of high-resolution electron microscopy. Certain common features may be found among the problems of ceramic interface studies. Importance of basal plane grain boundary, for example, is one of the characteristics of this type of heterogeneous compound. The crystalline heterogeneity has been ignored largely in the grain boundary structure study since it has been developed primarily for cubic metals. The new area of basic grain boundary interface structure study is opened now that description of this type of interface has become engineeringly important.

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