相位偏移法的分色反差校正

IF 2.1 3区 工程技术 Q2 MICROSCOPY Ultramicroscopy Pub Date : 2024-01-08 DOI:10.1016/j.ultramic.2024.113922
Christoph Hofer, Chuang Gao, Tamazouzt Chennit, Biao Yuan, Timothy J. Pennycook
{"title":"相位偏移法的分色反差校正","authors":"Christoph Hofer,&nbsp;Chuang Gao,&nbsp;Tamazouzt Chennit,&nbsp;Biao Yuan,&nbsp;Timothy J. Pennycook","doi":"10.1016/j.ultramic.2024.113922","DOIUrl":null,"url":null,"abstract":"<div><p>The contrast transfer function of direct ptychography methods such as the single side band (SSB) method are single signed, yet these methods still sometimes exhibit contrast reversals, most often where the projected potentials are strong. In thicker samples central focusing often provides the best ptychographic contrast as this leads to defocus variations within the sample canceling out. However focusing away from the entrance surface is often undesirable as this degrades the annular dark field (ADF) signal. Here we discuss how phase wrap asymptotes in the frequency response of SSB ptychography give rise to contrast reversals, without the need for dynamical scattering, and how these can be counteracted by manipulating the phases such that the asymptotes are either shifted to higher frequencies or damped via amplitude modulation. This is what enables post collection defocus correction of contrast reversals. However, the phase offset method of counteracting contrast reversals we introduce here is generally found to be superior to post collection application of defocus, with greater reliability and generally stronger contrast. Importantly, the phase offset method also works for thin and thick samples where central focusing does not. Finally, the independence of the method from focus is useful for optical sectioning involving ptychography, improving interpretability by better disentangling the effects of strong potentials and focus.</p></div>","PeriodicalId":23439,"journal":{"name":"Ultramicroscopy","volume":null,"pages":null},"PeriodicalIF":2.1000,"publicationDate":"2024-01-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.sciencedirect.com/science/article/pii/S0304399124000019/pdfft?md5=252f4115db9a421645fc1ecee48bc6fc&pid=1-s2.0-S0304399124000019-main.pdf","citationCount":"0","resultStr":"{\"title\":\"Phase offset method of ptychographic contrast reversal correction\",\"authors\":\"Christoph Hofer,&nbsp;Chuang Gao,&nbsp;Tamazouzt Chennit,&nbsp;Biao Yuan,&nbsp;Timothy J. Pennycook\",\"doi\":\"10.1016/j.ultramic.2024.113922\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<div><p>The contrast transfer function of direct ptychography methods such as the single side band (SSB) method are single signed, yet these methods still sometimes exhibit contrast reversals, most often where the projected potentials are strong. In thicker samples central focusing often provides the best ptychographic contrast as this leads to defocus variations within the sample canceling out. However focusing away from the entrance surface is often undesirable as this degrades the annular dark field (ADF) signal. Here we discuss how phase wrap asymptotes in the frequency response of SSB ptychography give rise to contrast reversals, without the need for dynamical scattering, and how these can be counteracted by manipulating the phases such that the asymptotes are either shifted to higher frequencies or damped via amplitude modulation. This is what enables post collection defocus correction of contrast reversals. However, the phase offset method of counteracting contrast reversals we introduce here is generally found to be superior to post collection application of defocus, with greater reliability and generally stronger contrast. Importantly, the phase offset method also works for thin and thick samples where central focusing does not. Finally, the independence of the method from focus is useful for optical sectioning involving ptychography, improving interpretability by better disentangling the effects of strong potentials and focus.</p></div>\",\"PeriodicalId\":23439,\"journal\":{\"name\":\"Ultramicroscopy\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":2.1000,\"publicationDate\":\"2024-01-08\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"https://www.sciencedirect.com/science/article/pii/S0304399124000019/pdfft?md5=252f4115db9a421645fc1ecee48bc6fc&pid=1-s2.0-S0304399124000019-main.pdf\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Ultramicroscopy\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://www.sciencedirect.com/science/article/pii/S0304399124000019\",\"RegionNum\":3,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q2\",\"JCRName\":\"MICROSCOPY\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Ultramicroscopy","FirstCategoryId":"5","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S0304399124000019","RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"MICROSCOPY","Score":null,"Total":0}
引用次数: 0

摘要

单边带(SSB)法等直接纵切法的对比度传递函数是单符号的,但这些方法有时仍会出现对比度反转,最常见的情况是投射电势较强。在较厚的样品中,中央聚焦通常能提供最佳的双曲面对比度,因为这会抵消样品内部的散焦变化。然而,远离入口表面的聚焦往往不可取,因为这会降低环形暗场(ADF)信号。在此,我们将讨论 SSB 层析成像技术频率响应中的相位包络渐近线是如何在不需要动态散射的情况下导致对比度反转的,以及如何通过操纵相位使渐近线移向更高频率或通过振幅调制抑制渐近线来抵消对比度反转。这就是实现对比度反转的采集后失焦校正的方法。然而,我们在此介绍的相位偏移方法在抵消对比度反转方面普遍优于采集后去焦,可靠性更高,对比度普遍更强。重要的是,相位偏移法还适用于薄而厚的样本,而中心聚焦法则不适用。最后,相位偏移法与聚焦无关,这对于涉及分层摄影的光学切片非常有用,它能更好地分离强电位和聚焦的影响,从而提高可解释性。
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Phase offset method of ptychographic contrast reversal correction

The contrast transfer function of direct ptychography methods such as the single side band (SSB) method are single signed, yet these methods still sometimes exhibit contrast reversals, most often where the projected potentials are strong. In thicker samples central focusing often provides the best ptychographic contrast as this leads to defocus variations within the sample canceling out. However focusing away from the entrance surface is often undesirable as this degrades the annular dark field (ADF) signal. Here we discuss how phase wrap asymptotes in the frequency response of SSB ptychography give rise to contrast reversals, without the need for dynamical scattering, and how these can be counteracted by manipulating the phases such that the asymptotes are either shifted to higher frequencies or damped via amplitude modulation. This is what enables post collection defocus correction of contrast reversals. However, the phase offset method of counteracting contrast reversals we introduce here is generally found to be superior to post collection application of defocus, with greater reliability and generally stronger contrast. Importantly, the phase offset method also works for thin and thick samples where central focusing does not. Finally, the independence of the method from focus is useful for optical sectioning involving ptychography, improving interpretability by better disentangling the effects of strong potentials and focus.

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来源期刊
Ultramicroscopy
Ultramicroscopy 工程技术-显微镜技术
CiteScore
4.60
自引率
13.60%
发文量
117
审稿时长
5.3 months
期刊介绍: Ultramicroscopy is an established journal that provides a forum for the publication of original research papers, invited reviews and rapid communications. The scope of Ultramicroscopy is to describe advances in instrumentation, methods and theory related to all modes of microscopical imaging, diffraction and spectroscopy in the life and physical sciences.
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