240 纳米氮化铝基深紫色微型发光二极管:尺寸效应与边缘效应

IF 4.8 4区 物理与天体物理 Q2 PHYSICS, CONDENSED MATTER Journal of Semiconductors Pub Date : 2024-01-01 DOI:10.1088/1674-4926/45/1/012504
Shunpeng Lu, Jiangxiao Bai, Hongbo Li, Ke Jiang, Jianwei Ben, Shanli Zhang, Zi-Hui Zhang, Xiaojuan Sun, Dabing Li
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引用次数: 0

摘要

设计并制造了不同尺寸的 240 nm AlGaN 基微型 LED。然后,通过比较尺寸和边缘效应,系统地研究了外部量子效率(EQE)和光提取效率(LEE)。结果表明,随着尺寸从 50.0 μm 缩小到 25.0 μm,峰值光输出功率增加了 81.83%。其中,LEE 增加了 26.21%,LEE 的增强主要来自侧壁光提取。最值得注意的是,由于倾斜的网格侧壁和铝反射器设计,横向磁(TM)模式光随着尺寸的缩小而加速增强。然而,当转向 12.5 μm 尺寸的微型 LED 时,输出功率却低于 25.0 μm 尺寸的微型 LED。其根本原因在于,即使受到二氧化硅钝化层的保护,导致漏电流和肖克利-雷德-霍尔(SRH)重组的边缘效应也会随着尺寸的进一步缩小而迅速恶化。此外,p-接触面积与介质面积之比大大降低,这也恶化了介质边缘的 p 型电流扩散。这些发现为设计波长低于 250 纳米的高效微型发光二极管提供了经验之谈,这将为深紫外(DUV)微型发光二极管的广泛应用铺平道路。
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240 nm AlGaN-based deep ultraviolet micro-LEDs: size effect versus edge effect
240 nm AlGaN-based micro-LEDs with different sizes are designed and fabricated. Then, the external quantum efficiency (EQE) and light extraction efficiency (LEE) are systematically investigated by comparing size and edge effects. Here, it is revealed that the peak optical output power increases by 81.83% with the size shrinking from 50.0 to 25.0 μm. Thereinto, the LEE increases by 26.21% and the LEE enhancement mainly comes from the sidewall light extraction. Most notably, transverse-magnetic (TM) mode light intensifies faster as the size shrinks due to the tilted mesa side-wall and Al reflector design. However, when it turns to 12.5 μm sized micro-LEDs, the output power is lower than 25.0 μm sized ones. The underlying mechanism is that even though protected by SiO2 passivation, the edge effect which leads to current leakage and Shockley-Read-Hall (SRH) recombination deteriorates rapidly with the size further shrinking. Moreover, the ratio of the p-contact area to mesa area is much lower, which deteriorates the p-type current spreading at the mesa edge. These findings show a role of thumb for the design of high efficiency micro-LEDs with wavelength below 250 nm, which will pave the way for wide applications of deep ultraviolet (DUV) micro-LEDs.
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来源期刊
Journal of Semiconductors
Journal of Semiconductors PHYSICS, CONDENSED MATTER-
CiteScore
6.70
自引率
9.80%
发文量
119
期刊介绍: Journal of Semiconductors publishes articles that emphasize semiconductor physics, materials, devices, circuits, and related technology.
期刊最新文献
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