Jiaming Wang, Fujun Xu, Lisheng Zhang, Jing Lang, Xuzhou Fang, Ziyao Zhang, Xueqi Guo, Chen Ji, Chengzhi Ji, Fuyun Tan, Xuelin Yang, Xiangning Kang, Zhixin Qin, Ning Tang, Xinqiang Wang, Weikun Ge, Bo Shen
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引用次数: 0
摘要
半导体的发展始终伴随着可控掺杂技术的进步。以氮化镓基紫外线(UV)发射器为例,尽管在波长为 275 纳米时的峰值插壁效率达到了 15.3%,但与氮化镓基可见光发光二极管(LED)相比仍存在巨大差距,这主要归因于氮化镓的掺杂效率随铝成分的增加而降低。首先,富铝 AlGaN 的 p 掺杂是一个长期存在的难题,低空穴浓度严重限制了载流子注入效率。虽然 p-GaN 包层作为一种折中方案被广泛采用,但空穴的高注入势垒以及不可避免的光提取损失不容忽视。而在 n 掺杂方面,主要问题是当铝的成分超过 80% 时,电性能会下降,从而导致 250 nm 以下紫外发光二极管的电效率较低。本综述总结了最近的研究进展,概述了高效掺杂富铝氮化铝的主要挑战,同时详细讨论了克服掺杂问题的相应方法。
The development of semiconductors is always accompanied by the progress in controllable doping techniques. Taking AlGaN-based ultraviolet (UV) emitters as an example, despite a peak wall-plug efficiency of 15.3% at the wavelength of 275 nm, there is still a huge gap in comparison with GaN-based visible light-emitting diodes (LEDs), mainly attributed to the inefficient doping of AlGaN with increase of the Al composition. First, p-doping of Al-rich AlGaN is a long-standing challenge and the low hole concentration seriously restricts the carrier injection efficiency. Although p-GaN cladding layers are widely adopted as a compromise, the high injection barrier of holes as well as the inevitable loss of light extraction cannot be neglected. While in terms of n-doping the main issue is the degradation of the electrical property when the Al composition exceeds 80%, resulting in a low electrical efficiency in sub-250 nm UV-LEDs. This review summarizes the recent advances and outlines the major challenges in the efficient doping of Al-rich AlGaN, meanwhile the corresponding approaches pursued to overcome the doping issues are discussed in detail.