{"title":"83Pb/10Sb/5Sn2Ag 和 91.5Sn/8.5Sb 中间焊料的恒应变速率加罗法洛蠕变行为","authors":"Eric Stang, Cherish Lesko, Henry Young","doi":"10.1115/1.4064751","DOIUrl":null,"url":null,"abstract":"\n Modern electronics reliability prediction models require materials-specific failure data across a range of conditions. For solder creep data, Garofalo models are preferred due to their ability to accurately predict performance over a wide temperature range. However, Garofalo data on intermediate solders is sparse, especially regarding performance at cold temperatures. Here, we report on creep phenomena of 83Pb/10Sb/5Sn2Ag (Indalloy 236) and 91.5Sn/8.5Sb (Indalloy 264). Indalloy 236 creep exhibits an activation energy of 83.6 kJ/mol, n=4.46 and a=0.0673, while Indalloy 264 exhibits an activation energy of 57.59 kJ/mol, n=5.89 and a=0.0306 from -20°C to 175°C. X-ray diffraction (XRD), scanning electron microscopy (SEM), and energy dispersive spectroscopy (EDS) were used to characterize the changes in the alloy phases as a result of the creep. Microstructural analysis indicates that Indalloy 236 experiences void coalescence with high diffusion rates while Indalloy 264 precipitates antimony-rich phases on the grain broundaries.","PeriodicalId":15663,"journal":{"name":"Journal of Electronic Packaging","volume":null,"pages":null},"PeriodicalIF":2.2000,"publicationDate":"2024-02-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Constant Strain-Rate Garofalo Creep Behavior of Intermediate 83Pb/10Sb/5Sn2Ag and 91.5Sn/8.5Sb Solder Materials\",\"authors\":\"Eric Stang, Cherish Lesko, Henry Young\",\"doi\":\"10.1115/1.4064751\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\\n Modern electronics reliability prediction models require materials-specific failure data across a range of conditions. For solder creep data, Garofalo models are preferred due to their ability to accurately predict performance over a wide temperature range. However, Garofalo data on intermediate solders is sparse, especially regarding performance at cold temperatures. Here, we report on creep phenomena of 83Pb/10Sb/5Sn2Ag (Indalloy 236) and 91.5Sn/8.5Sb (Indalloy 264). Indalloy 236 creep exhibits an activation energy of 83.6 kJ/mol, n=4.46 and a=0.0673, while Indalloy 264 exhibits an activation energy of 57.59 kJ/mol, n=5.89 and a=0.0306 from -20°C to 175°C. X-ray diffraction (XRD), scanning electron microscopy (SEM), and energy dispersive spectroscopy (EDS) were used to characterize the changes in the alloy phases as a result of the creep. Microstructural analysis indicates that Indalloy 236 experiences void coalescence with high diffusion rates while Indalloy 264 precipitates antimony-rich phases on the grain broundaries.\",\"PeriodicalId\":15663,\"journal\":{\"name\":\"Journal of Electronic Packaging\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":2.2000,\"publicationDate\":\"2024-02-12\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Journal of Electronic Packaging\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://doi.org/10.1115/1.4064751\",\"RegionNum\":4,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q3\",\"JCRName\":\"ENGINEERING, ELECTRICAL & ELECTRONIC\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Electronic Packaging","FirstCategoryId":"5","ListUrlMain":"https://doi.org/10.1115/1.4064751","RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
Constant Strain-Rate Garofalo Creep Behavior of Intermediate 83Pb/10Sb/5Sn2Ag and 91.5Sn/8.5Sb Solder Materials
Modern electronics reliability prediction models require materials-specific failure data across a range of conditions. For solder creep data, Garofalo models are preferred due to their ability to accurately predict performance over a wide temperature range. However, Garofalo data on intermediate solders is sparse, especially regarding performance at cold temperatures. Here, we report on creep phenomena of 83Pb/10Sb/5Sn2Ag (Indalloy 236) and 91.5Sn/8.5Sb (Indalloy 264). Indalloy 236 creep exhibits an activation energy of 83.6 kJ/mol, n=4.46 and a=0.0673, while Indalloy 264 exhibits an activation energy of 57.59 kJ/mol, n=5.89 and a=0.0306 from -20°C to 175°C. X-ray diffraction (XRD), scanning electron microscopy (SEM), and energy dispersive spectroscopy (EDS) were used to characterize the changes in the alloy phases as a result of the creep. Microstructural analysis indicates that Indalloy 236 experiences void coalescence with high diffusion rates while Indalloy 264 precipitates antimony-rich phases on the grain broundaries.
期刊介绍:
The Journal of Electronic Packaging publishes papers that use experimental and theoretical (analytical and computer-aided) methods, approaches, and techniques to address and solve various mechanical, materials, and reliability problems encountered in the analysis, design, manufacturing, testing, and operation of electronic and photonics components, devices, and systems.
Scope: Microsystems packaging; Systems integration; Flexible electronics; Materials with nano structures and in general small scale systems.