结合波和粒子效应模拟 X 射线相位对比--综述

Emilie Pietersoone, JM Létang, S. Rit, Emmanuel Brun, Max Langer
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摘要

X 射线相位对比成像(XPCI)是一系列成像技术,可通过样品中的相位变化使对比显现出来。相位敏感技术的灵敏度可能比基于衰减的技术高出几个数量级,可应用于从生物医学到材料科学等广泛领域。通过对 XPCI 的精确模拟,可以对成像实验进行规划,从而减少为寻找合适的成像参数而进行昂贵的同步加速器光束访问的需要。它还能为最近提出的基于机器学习的相位检索算法提供训练数据。XPCI 的模拟通常采用波光学或射线光学方法。然而,这些方法无法模拟实验图像中存在的所有伪影。人们对暗场成像的兴趣日益浓厚,这也促使 XPCI 仿真代码中加入了散射。散射通常使用蒙特卡洛粒子传输代码进行模拟。事实证明,将这两种观点结合起来并不简单,因此提出了几种方法。我们回顾了有关 XPCI 仿真的现有文献,重点介绍了包括散射部分在内的特定方法,并讨论了在 XPCI 中模拟波和粒子效应的未来可能方向。
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Combining Wave and Particle Effects in the Simulation of X-ray Phase Contrast—A Review
X-ray phase-contrast imaging (XPCI) is a family of imaging techniques that makes contrast visible due to phase shifts in the sample. Phase-sensitive techniques can potentially be several orders of magnitude more sensitive than attenuation-based techniques, finding applications in a wide range of fields, from biomedicine to materials science. The accurate simulation of XPCI allows for the planning of imaging experiments, potentially reducing the need for costly synchrotron beam access to find suitable imaging parameters. It can also provide training data for recently proposed machine learning-based phase retrieval algorithms. The simulation of XPCI has classically been carried out using wave optics or ray optics approaches. However, these approaches have not been capable of simulating all the artifacts present in experimental images. The increased interest in dark-field imaging has also prompted the inclusion of scattering in XPCI simulation codes. Scattering is classically simulated using Monte Carlo particle transport codes. The combination of the two perspectives has proven not to be straightforward, and several methods have been proposed. We review the available literature on the simulation of XPCI with attention given to particular methods, including the scattering component, and discuss the possible future directions for the simulation of both wave and particle effects in XPCI.
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