{"title":"矢量网络分析仪的校准方法,使用一条线和三个或更多偏移反射标准件","authors":"Yujie Liu, Guobin Wan, Changying Wu, Yevhen Yashchyshyn, Yingfan Wang, Limin Tu","doi":"10.1515/freq-2023-0116","DOIUrl":null,"url":null,"abstract":"This article proposes a method for two-port vector network analyzer (VNA) calibration that uses a line standard and three or more offset-reflect standards (L<jats:italic>n</jats:italic>Γ, where <jats:italic>n</jats:italic> is the number of offset-reflect standards and <jats:italic>n </jats:italic>≥<jats:italic> </jats:italic>3). The reflection coefficient of the highly reflecting offset-reflect standards and the propagation constant of the transmission line are unknown for this calibration method, but they can be obtained in the process of calculating the VNA calibration error coefficients. In the L<jats:italic>n</jats:italic>Γ calibration method, the calibration fixtures are all equal in mechanical length. Therefore, compared with the thru-reflect-line (TRL) method, this calibration method is convenient when the test fixtures of both sides of the VNA are fixed or difficult to move during the measurement. To further simplify the experimental operation, a corrugated reflector is also designed. In this calibration method, only one corrugated reflector used as the offset-reflect standard is needed. Different offset-reflect standards are realized easily by changing the position on the microstrip line. The proposed L<jats:italic>n</jats:italic>Γ calibration method is accurate, which is proven by theoretical analysis, simulations, and measurements.","PeriodicalId":55143,"journal":{"name":"Frequenz","volume":"106 1","pages":""},"PeriodicalIF":0.8000,"publicationDate":"2024-03-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"A calibration method for vector network analyzers using a line and three or more offset-reflect standards\",\"authors\":\"Yujie Liu, Guobin Wan, Changying Wu, Yevhen Yashchyshyn, Yingfan Wang, Limin Tu\",\"doi\":\"10.1515/freq-2023-0116\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This article proposes a method for two-port vector network analyzer (VNA) calibration that uses a line standard and three or more offset-reflect standards (L<jats:italic>n</jats:italic>Γ, where <jats:italic>n</jats:italic> is the number of offset-reflect standards and <jats:italic>n </jats:italic>≥<jats:italic> </jats:italic>3). The reflection coefficient of the highly reflecting offset-reflect standards and the propagation constant of the transmission line are unknown for this calibration method, but they can be obtained in the process of calculating the VNA calibration error coefficients. In the L<jats:italic>n</jats:italic>Γ calibration method, the calibration fixtures are all equal in mechanical length. Therefore, compared with the thru-reflect-line (TRL) method, this calibration method is convenient when the test fixtures of both sides of the VNA are fixed or difficult to move during the measurement. To further simplify the experimental operation, a corrugated reflector is also designed. In this calibration method, only one corrugated reflector used as the offset-reflect standard is needed. Different offset-reflect standards are realized easily by changing the position on the microstrip line. The proposed L<jats:italic>n</jats:italic>Γ calibration method is accurate, which is proven by theoretical analysis, simulations, and measurements.\",\"PeriodicalId\":55143,\"journal\":{\"name\":\"Frequenz\",\"volume\":\"106 1\",\"pages\":\"\"},\"PeriodicalIF\":0.8000,\"publicationDate\":\"2024-03-12\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Frequenz\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://doi.org/10.1515/freq-2023-0116\",\"RegionNum\":4,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q4\",\"JCRName\":\"ENGINEERING, ELECTRICAL & ELECTRONIC\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Frequenz","FirstCategoryId":"5","ListUrlMain":"https://doi.org/10.1515/freq-2023-0116","RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q4","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0
摘要
本文提出了一种双端口矢量网络分析仪(VNA)校准方法,该方法使用一个线路标准和三个或更多偏移反射标准(LnΓ,其中 n 为偏移反射标准的数量,且 n ≥ 3)。在这种校准方法中,高反射偏移反射标准件的反射系数和传输线的传播常数是未知的,但可以在计算 VNA 校准误差系数的过程中获得。在 LnΓ 校准方法中,所有校准夹具的机械长度都相等。因此,与直通反射线(TRL)方法相比,当 VNA 两侧的测试夹具固定不动或在测量过程中难以移动时,这种校准方法非常方便。为了进一步简化实验操作,还设计了波纹反射器。在这种校准方法中,只需要一个波纹反射器作为偏移反射标准。通过改变微带线上的位置,可以轻松实现不同的偏移反射标准。通过理论分析、模拟和测量,证明了所提出的 LnΓ 校准方法是精确的。
A calibration method for vector network analyzers using a line and three or more offset-reflect standards
This article proposes a method for two-port vector network analyzer (VNA) calibration that uses a line standard and three or more offset-reflect standards (LnΓ, where n is the number of offset-reflect standards and n ≥3). The reflection coefficient of the highly reflecting offset-reflect standards and the propagation constant of the transmission line are unknown for this calibration method, but they can be obtained in the process of calculating the VNA calibration error coefficients. In the LnΓ calibration method, the calibration fixtures are all equal in mechanical length. Therefore, compared with the thru-reflect-line (TRL) method, this calibration method is convenient when the test fixtures of both sides of the VNA are fixed or difficult to move during the measurement. To further simplify the experimental operation, a corrugated reflector is also designed. In this calibration method, only one corrugated reflector used as the offset-reflect standard is needed. Different offset-reflect standards are realized easily by changing the position on the microstrip line. The proposed LnΓ calibration method is accurate, which is proven by theoretical analysis, simulations, and measurements.
期刊介绍:
Frequenz is one of the leading scientific and technological journals covering all aspects of RF-, Microwave-, and THz-Engineering. It is a peer-reviewed, bi-monthly published journal.
Frequenz was first published in 1947 with a circulation of 7000 copies, focusing on telecommunications. Today, the major objective of Frequenz is to highlight current research activities and development efforts in RF-, Microwave-, and THz-Engineering throughout a wide frequency spectrum ranging from radio via microwave up to THz frequencies.
RF-, Microwave-, and THz-Engineering is a very active area of Research & Development as well as of Applications in a wide variety of fields. It has been the key to enabling technologies responsible for phenomenal growth of satellite broadcasting, wireless communications, satellite and terrestrial mobile communications and navigation, high-speed THz communication systems. It will open up new technologies in communications, radar, remote sensing and imaging, in identification and localization as well as in sensors, e.g. for wireless industrial process and environmental monitoring as well as for biomedical sensing.