{"title":"阶跃应力加速寿命测试中的间距积估算:最大似然法的替代方法","authors":"Maria Kateri;Nikolay I. Nikolov","doi":"10.1109/TR.2024.3369977","DOIUrl":null,"url":null,"abstract":"Accelerated life testing (ALT) experiments are widely used in reliability studies on extremely durable products having large mean times to failure. Simple step-stress ALT (SSALT) is a special class of ALT that tests the units under investigation on two different conditions by changing the stress factor (e.g., temperature, voltage, or pressure) at a predetermined time point of the experiment. In this study, we propose the maximum product of spacings (MPS) technique for estimating the unknown lifetime parameters as an alternative to the maximum likelihood (ML), which in some cases is not possible to be used. The MPS estimator is defined for a simple SSALT model under Type-II censoring and proved to be asymptotically equivalent to the corresponding ML estimator. The specific case of Weibull lifetimes sharing a common shape parameter on both stress levels under the tampered failure rate assumption is considered in more detail. Existence and uniqueness results are shown for the point estimators of both methods and an adjusted bootstrap algorithm is suggested for constructing interval inference procedures. Further, the ML and MPS approaches are compared via a simulation study and applied to two real lifetime data examples.","PeriodicalId":56305,"journal":{"name":"IEEE Transactions on Reliability","volume":"73 3","pages":"1433-1445"},"PeriodicalIF":5.0000,"publicationDate":"2024-03-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Product of Spacings Estimation in Step-Stress Accelerated Life Testing: An Alternative to Maximum Likelihood\",\"authors\":\"Maria Kateri;Nikolay I. Nikolov\",\"doi\":\"10.1109/TR.2024.3369977\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Accelerated life testing (ALT) experiments are widely used in reliability studies on extremely durable products having large mean times to failure. Simple step-stress ALT (SSALT) is a special class of ALT that tests the units under investigation on two different conditions by changing the stress factor (e.g., temperature, voltage, or pressure) at a predetermined time point of the experiment. In this study, we propose the maximum product of spacings (MPS) technique for estimating the unknown lifetime parameters as an alternative to the maximum likelihood (ML), which in some cases is not possible to be used. The MPS estimator is defined for a simple SSALT model under Type-II censoring and proved to be asymptotically equivalent to the corresponding ML estimator. The specific case of Weibull lifetimes sharing a common shape parameter on both stress levels under the tampered failure rate assumption is considered in more detail. Existence and uniqueness results are shown for the point estimators of both methods and an adjusted bootstrap algorithm is suggested for constructing interval inference procedures. Further, the ML and MPS approaches are compared via a simulation study and applied to two real lifetime data examples.\",\"PeriodicalId\":56305,\"journal\":{\"name\":\"IEEE Transactions on Reliability\",\"volume\":\"73 3\",\"pages\":\"1433-1445\"},\"PeriodicalIF\":5.0000,\"publicationDate\":\"2024-03-18\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE Transactions on Reliability\",\"FirstCategoryId\":\"94\",\"ListUrlMain\":\"https://ieeexplore.ieee.org/document/10472405/\",\"RegionNum\":2,\"RegionCategory\":\"计算机科学\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q1\",\"JCRName\":\"COMPUTER SCIENCE, HARDWARE & ARCHITECTURE\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Transactions on Reliability","FirstCategoryId":"94","ListUrlMain":"https://ieeexplore.ieee.org/document/10472405/","RegionNum":2,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"COMPUTER SCIENCE, HARDWARE & ARCHITECTURE","Score":null,"Total":0}
引用次数: 0
摘要
加速寿命试验(ALT)广泛应用于对平均失效时间较长的耐用产品进行可靠性研究。简单阶跃应力加速寿命测试(SSALT)是一种特殊的加速寿命测试,它通过在实验的预定时间点改变应力因子(如温度、电压或压力),在两种不同的条件下对被测单元进行测试。在本研究中,我们提出了最大间距积(MPS)技术,用于估计未知寿命参数,以替代在某些情况下无法使用的最大似然法(ML)。MPS 估计器是为 II 型普查下的简单 SSALT 模型定义的,并证明其与相应的 ML 估计器在渐近上是等效的。更详细地考虑了在篡改失效率假设下,两个应力水平上的 Weibull 寿命具有共同形状参数的特定情况。结果显示了两种方法的点估计器的存在性和唯一性,并提出了一种用于构建区间推断程序的调整自举算法。此外,还通过模拟研究对 ML 和 MPS 方法进行了比较,并将其应用于两个实际寿命数据实例。
Product of Spacings Estimation in Step-Stress Accelerated Life Testing: An Alternative to Maximum Likelihood
Accelerated life testing (ALT) experiments are widely used in reliability studies on extremely durable products having large mean times to failure. Simple step-stress ALT (SSALT) is a special class of ALT that tests the units under investigation on two different conditions by changing the stress factor (e.g., temperature, voltage, or pressure) at a predetermined time point of the experiment. In this study, we propose the maximum product of spacings (MPS) technique for estimating the unknown lifetime parameters as an alternative to the maximum likelihood (ML), which in some cases is not possible to be used. The MPS estimator is defined for a simple SSALT model under Type-II censoring and proved to be asymptotically equivalent to the corresponding ML estimator. The specific case of Weibull lifetimes sharing a common shape parameter on both stress levels under the tampered failure rate assumption is considered in more detail. Existence and uniqueness results are shown for the point estimators of both methods and an adjusted bootstrap algorithm is suggested for constructing interval inference procedures. Further, the ML and MPS approaches are compared via a simulation study and applied to two real lifetime data examples.
期刊介绍:
IEEE Transactions on Reliability is a refereed journal for the reliability and allied disciplines including, but not limited to, maintainability, physics of failure, life testing, prognostics, design and manufacture for reliability, reliability for systems of systems, network availability, mission success, warranty, safety, and various measures of effectiveness. Topics eligible for publication range from hardware to software, from materials to systems, from consumer and industrial devices to manufacturing plants, from individual items to networks, from techniques for making things better to ways of predicting and measuring behavior in the field. As an engineering subject that supports new and existing technologies, we constantly expand into new areas of the assurance sciences.