{"title":"通过真空应力张量实现基底上切尔-西蒙斯层的卡西米尔相互作用","authors":"V. Marachevsky, A. Sidelnikov","doi":"10.3390/physics6020033","DOIUrl":null,"url":null,"abstract":"We develop a Green’s functions scattering method for systems with Chern–Simons plane boundary layers on dielectric half-spaces. The Casimir pressure is derived by evaluation of the stress tensor in a vacuum slit between two half-spaces. The sign of the Casimir pressure on a Chern–Simons plane layer separated by a vacuum slit from the Chern–Simons layer at the boundary of a dielectric half-space is analyzed for intrinsic Si and SiO2 glass substrates.","PeriodicalId":509432,"journal":{"name":"Physics","volume":"169 ","pages":""},"PeriodicalIF":0.0000,"publicationDate":"2024-04-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Casimir Interaction of Chern–Simons Layers on Substrates via Vacuum Stress Tensor\",\"authors\":\"V. Marachevsky, A. Sidelnikov\",\"doi\":\"10.3390/physics6020033\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"We develop a Green’s functions scattering method for systems with Chern–Simons plane boundary layers on dielectric half-spaces. The Casimir pressure is derived by evaluation of the stress tensor in a vacuum slit between two half-spaces. The sign of the Casimir pressure on a Chern–Simons plane layer separated by a vacuum slit from the Chern–Simons layer at the boundary of a dielectric half-space is analyzed for intrinsic Si and SiO2 glass substrates.\",\"PeriodicalId\":509432,\"journal\":{\"name\":\"Physics\",\"volume\":\"169 \",\"pages\":\"\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2024-04-02\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Physics\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.3390/physics6020033\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Physics","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.3390/physics6020033","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
摘要
我们针对介电半空间上的切尔-西蒙平面边界层系统开发了一种格林函数散射方法。卡西米尔压力是通过评估两个半空间之间真空狭缝中的应力张量得出的。针对本征 Si 和 SiO2 玻璃衬底,分析了被真空缝隙与介电半空间边界上的 Chern-Simons 层隔开的 Chern-Simons 平面层上的卡西米尔压力的符号。
Casimir Interaction of Chern–Simons Layers on Substrates via Vacuum Stress Tensor
We develop a Green’s functions scattering method for systems with Chern–Simons plane boundary layers on dielectric half-spaces. The Casimir pressure is derived by evaluation of the stress tensor in a vacuum slit between two half-spaces. The sign of the Casimir pressure on a Chern–Simons plane layer separated by a vacuum slit from the Chern–Simons layer at the boundary of a dielectric half-space is analyzed for intrinsic Si and SiO2 glass substrates.