在婴儿模型上模拟验证 8 通道平行发射偶极子阵列:包括射频损耗以实现与实验结果的可靠相关性

Jérémie Clément, Ö. Ipek
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摘要

至关重要的是,要证明模拟与制造的并行发射(pTx)阵列性能之间存在稳健的相关性,以取消目前使用的限制性很大的安全裕度。在本研究中,我们介绍了仿真模型与 7T 下 8 通道偶极子阵列实验结果的定性和定量验证。我们介绍了一种将射频损耗纳入仿真模型的方法,并与忽略这些损耗的仿真模型进行了比较。模拟的 S 矩阵和单个 B1+ 场图与实验测量的数量进行了比较。采用所提出的方法,发现模拟和实验反射系数之间的平均相对差异约为 1.1%,第一耦合项约为 4.2%,第二耦合项约为 9.4%。实验和模拟的单个 B1+ 场图之间的最大归一化均方根误差为 4.8%。通过与实验数据的比较,我们对模拟模型准确预测 B1+ 场模式的有效性进行了定性和定量评估。我们得出的结论是,利用所提出的射频损耗模型,在 7T 下使用 8 通道偶极子阵列可在模拟数据和实验数据之间实现稳健的相关性。
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Simulation Validation of an 8-Channel Parallel-Transmit Dipole Array on an Infant Phantom: Including RF Losses for Robust Correlation with Experimental Results
It is crucial to demonstrate a robust correlation between the simulated and manufactured parallel-transmit (pTx) arrays performances to release the currently-used, very restrictive safety margins. In this study, we describe the qualitative and quantitative validation of a simulation model with respect to experimental results for an 8-channel dipole array at 7T. An approach that includes the radiofrequency losses into the simulation model is presented and compared to simulation models neglecting these losses. Simulated S-matrices and individual B1+-field maps were compared with experimentally measured quantities. With the proposed approach, an average relative difference of ~1.1% was found between simulated and experimental reflection coefficients, ~4.2% for the 1st coupling terms, and ~9.4% for the 2nd coupling terms. A maximum normalized root-mean-square error of 4.8% was achieved between experimental and simulated individual B1+-field maps. The effectiveness of the simulation model to accurately predict the B1+-field patterns was assessed, qualitatively and quantitatively, through a comparison with experimental data. We conclude that, using the proposed model for radiofrequency losses, a robust correlation is achieved between simulated and experimental data using the 8-channel dipole array at 7T.
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