在语义分割应用中检测和掩盖故障的技术

IF 1.6 4区 工程技术 Q3 ENGINEERING, ELECTRICAL & ELECTRONIC Microelectronics Reliability Pub Date : 2024-05-06 DOI:10.1016/j.microrel.2024.115397
Stéphane Burel , Adrian Evans , Lorena Anghel
{"title":"在语义分割应用中检测和掩盖故障的技术","authors":"Stéphane Burel ,&nbsp;Adrian Evans ,&nbsp;Lorena Anghel","doi":"10.1016/j.microrel.2024.115397","DOIUrl":null,"url":null,"abstract":"<div><p>Semantic segmentation of images is essential for many applications including autonomous driving and modern DNNs now achieve high accuracy. Automotive systems are safety critical systems and in turn they must comply with safety standards, requiring at least hardware fault detection capability. Small embedded applications also require some level of fault tolerance, while operating with a tight power budget. In this paper, we first present a detailed analysis of the effects of faults using Google’s DeepLabV3+ network processing an industrial data-set. Further to that, two techniques to mitigate hardware faults are proposed. The first one is a symptom-based fault detection algorithm shown to detect <span><math><mo>&gt;</mo></math></span>99% of critical faults with zero false positives and a compute overhead of 0.2%. The second one is a simpler technique, using a clipped ReLU activation function, to quickly mask over 99% of the critical faults in the activation values.</p></div>","PeriodicalId":51131,"journal":{"name":"Microelectronics Reliability","volume":"157 ","pages":"Article 115397"},"PeriodicalIF":1.6000,"publicationDate":"2024-05-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.sciencedirect.com/science/article/pii/S0026271424000775/pdfft?md5=ab7f5a1dc7df4567e359a7d1675b14ad&pid=1-s2.0-S0026271424000775-main.pdf","citationCount":"0","resultStr":"{\"title\":\"Techniques for detecting and masking faults in semantic segmentation applications\",\"authors\":\"Stéphane Burel ,&nbsp;Adrian Evans ,&nbsp;Lorena Anghel\",\"doi\":\"10.1016/j.microrel.2024.115397\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<div><p>Semantic segmentation of images is essential for many applications including autonomous driving and modern DNNs now achieve high accuracy. Automotive systems are safety critical systems and in turn they must comply with safety standards, requiring at least hardware fault detection capability. Small embedded applications also require some level of fault tolerance, while operating with a tight power budget. In this paper, we first present a detailed analysis of the effects of faults using Google’s DeepLabV3+ network processing an industrial data-set. Further to that, two techniques to mitigate hardware faults are proposed. The first one is a symptom-based fault detection algorithm shown to detect <span><math><mo>&gt;</mo></math></span>99% of critical faults with zero false positives and a compute overhead of 0.2%. The second one is a simpler technique, using a clipped ReLU activation function, to quickly mask over 99% of the critical faults in the activation values.</p></div>\",\"PeriodicalId\":51131,\"journal\":{\"name\":\"Microelectronics Reliability\",\"volume\":\"157 \",\"pages\":\"Article 115397\"},\"PeriodicalIF\":1.6000,\"publicationDate\":\"2024-05-06\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"https://www.sciencedirect.com/science/article/pii/S0026271424000775/pdfft?md5=ab7f5a1dc7df4567e359a7d1675b14ad&pid=1-s2.0-S0026271424000775-main.pdf\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Microelectronics Reliability\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://www.sciencedirect.com/science/article/pii/S0026271424000775\",\"RegionNum\":4,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q3\",\"JCRName\":\"ENGINEERING, ELECTRICAL & ELECTRONIC\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Microelectronics Reliability","FirstCategoryId":"5","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S0026271424000775","RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0

摘要

图像的语义分割对于包括自动驾驶在内的许多应用都至关重要,而现代 DNN 目前已达到很高的精度。汽车系统是安全关键型系统,因此必须符合安全标准,至少需要具备硬件故障检测能力。小型嵌入式应用也需要一定程度的容错能力,同时还要在严格的功率预算下运行。在本文中,我们首先利用谷歌 DeepLabV3+ 网络处理工业数据集,详细分析了故障的影响。此外,我们还提出了两种缓解硬件故障的技术。第一种是基于症状的故障检测算法,该算法能检测出 99% 的关键故障,误报率为零,计算开销仅为 0.2%。第二种是一种更简单的技术,使用剪切 ReLU 激活函数,在激活值中快速屏蔽 99% 以上的关键故障。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
Techniques for detecting and masking faults in semantic segmentation applications

Semantic segmentation of images is essential for many applications including autonomous driving and modern DNNs now achieve high accuracy. Automotive systems are safety critical systems and in turn they must comply with safety standards, requiring at least hardware fault detection capability. Small embedded applications also require some level of fault tolerance, while operating with a tight power budget. In this paper, we first present a detailed analysis of the effects of faults using Google’s DeepLabV3+ network processing an industrial data-set. Further to that, two techniques to mitigate hardware faults are proposed. The first one is a symptom-based fault detection algorithm shown to detect >99% of critical faults with zero false positives and a compute overhead of 0.2%. The second one is a simpler technique, using a clipped ReLU activation function, to quickly mask over 99% of the critical faults in the activation values.

求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
Microelectronics Reliability
Microelectronics Reliability 工程技术-工程:电子与电气
CiteScore
3.30
自引率
12.50%
发文量
342
审稿时长
68 days
期刊介绍: Microelectronics Reliability, is dedicated to disseminating the latest research results and related information on the reliability of microelectronic devices, circuits and systems, from materials, process and manufacturing, to design, testing and operation. The coverage of the journal includes the following topics: measurement, understanding and analysis; evaluation and prediction; modelling and simulation; methodologies and mitigation. Papers which combine reliability with other important areas of microelectronics engineering, such as design, fabrication, integration, testing, and field operation will also be welcome, and practical papers reporting case studies in the field and specific application domains are particularly encouraged. Most accepted papers will be published as Research Papers, describing significant advances and completed work. Papers reviewing important developing topics of general interest may be accepted for publication as Review Papers. Urgent communications of a more preliminary nature and short reports on completed practical work of current interest may be considered for publication as Research Notes. All contributions are subject to peer review by leading experts in the field.
期刊最新文献
Study on single-event burnout hardening with reduction of hole current density by top polysilicon diode of SOI LDMOS based on TCAD simulations An online junction temperature detection circuit for SiC MOSFETs considering threshold voltage drift compensation Thermal cycling reliability of electronic components in bolted assemblies: A study of the influence of bolt position The impact of negative gate voltage on neutron-induced single event effects for SiC MOSFETs Research on equivalent modeling and model testing verification methods for material mechanics parameters of TXV structure
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1