{"title":"开发不完美晶体中 X 射线和电子的创新衍射散射理论。","authors":"Felix N Chukhovskii","doi":"10.1107/S2053273324002730","DOIUrl":null,"url":null,"abstract":"<p><p>Fundamental equations describing the X-ray and electron diffraction scattering in imperfect crystals have been derived in the form of the matrix Fredholm-Volterra integral equation of the second kind. A theoretical approach has been developed using the perfect-crystal Green function formalism. In contrast, another approach utilizes the wavefield eigenfunctions related to the diagonalized matrix propagators of the conventional Takagi-Taupin and Howie-Whelan equations. Using the Liouville-Neumann-type series formalism for building up the matrix Fredholm-Volterra integral equation solutions, the general resolvent function solutions of the X-ray and electron diffraction boundary-valued Cauchy problems have been obtained. Based on the resolvent-type solutions, the aim is to reveal the features of the diffraction scattering onto the crystal lattice defects, including the mechanisms of intra- and interbranch wave scattering in the strongly deformed regions in the vicinity of crystal lattice defect cores. Using the two-stage resolvent solution of the second order, this approach has been supported by straightforward calculation of the electron bright- and dark-field contrasts of an edge dislocation in a thick foil. The results obtained for the bright- and dark-field profiles of the edge dislocation are discussed and compared with analogous ones numerically calculated by Howie & Whelan [Proc. R. Soc. A (1962), 267, 206].</p>","PeriodicalId":106,"journal":{"name":"Acta Crystallographica Section A: Foundations and Advances","volume":" ","pages":"305-314"},"PeriodicalIF":1.9000,"publicationDate":"2024-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Development of an innovative diffraction scattering theory of X-rays and electrons in imperfect crystals.\",\"authors\":\"Felix N Chukhovskii\",\"doi\":\"10.1107/S2053273324002730\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<p><p>Fundamental equations describing the X-ray and electron diffraction scattering in imperfect crystals have been derived in the form of the matrix Fredholm-Volterra integral equation of the second kind. A theoretical approach has been developed using the perfect-crystal Green function formalism. In contrast, another approach utilizes the wavefield eigenfunctions related to the diagonalized matrix propagators of the conventional Takagi-Taupin and Howie-Whelan equations. Using the Liouville-Neumann-type series formalism for building up the matrix Fredholm-Volterra integral equation solutions, the general resolvent function solutions of the X-ray and electron diffraction boundary-valued Cauchy problems have been obtained. Based on the resolvent-type solutions, the aim is to reveal the features of the diffraction scattering onto the crystal lattice defects, including the mechanisms of intra- and interbranch wave scattering in the strongly deformed regions in the vicinity of crystal lattice defect cores. Using the two-stage resolvent solution of the second order, this approach has been supported by straightforward calculation of the electron bright- and dark-field contrasts of an edge dislocation in a thick foil. The results obtained for the bright- and dark-field profiles of the edge dislocation are discussed and compared with analogous ones numerically calculated by Howie & Whelan [Proc. R. Soc. A (1962), 267, 206].</p>\",\"PeriodicalId\":106,\"journal\":{\"name\":\"Acta Crystallographica Section A: Foundations and Advances\",\"volume\":\" \",\"pages\":\"305-314\"},\"PeriodicalIF\":1.9000,\"publicationDate\":\"2024-07-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Acta Crystallographica Section A: Foundations and Advances\",\"FirstCategoryId\":\"1\",\"ListUrlMain\":\"https://doi.org/10.1107/S2053273324002730\",\"RegionNum\":4,\"RegionCategory\":\"材料科学\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"2024/5/31 0:00:00\",\"PubModel\":\"Epub\",\"JCR\":\"Q3\",\"JCRName\":\"CHEMISTRY, MULTIDISCIPLINARY\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Acta Crystallographica Section A: Foundations and Advances","FirstCategoryId":"1","ListUrlMain":"https://doi.org/10.1107/S2053273324002730","RegionNum":4,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"2024/5/31 0:00:00","PubModel":"Epub","JCR":"Q3","JCRName":"CHEMISTRY, MULTIDISCIPLINARY","Score":null,"Total":0}
引用次数: 0
摘要
描述不完全晶体中 X 射线和电子衍射散射的基本方程是以矩阵 Fredholm-Volterra 第二种积分方程的形式推导出来的。一种理论方法是利用完美晶体的格林函数形式主义。相反,另一种方法则利用了与传统高木-陶平方程和豪伊-惠兰方程的对角化矩阵传播者相关的波场特征函数。利用 Liouville-Neumann 型数列形式建立矩阵 Fredholm-Volterra 积分方程解,得到了 X 射线和电子衍射边界值考奇问题的一般解析函数解。基于解析型解法,目的是揭示衍射散射到晶格缺陷上的特征,包括晶格缺陷核心附近强变形区域的支内和支间波散射机制。利用二阶的两级解析解,通过直接计算厚箔中边缘位错的电子亮场和暗场对比,支持了这一方法。本文讨论了边缘位错的明场和暗场剖面,并与 Howie 和 Whelan [Proc. R. Soc. A (1962), 267, 206] 的类似数值计算结果进行了比较。
Development of an innovative diffraction scattering theory of X-rays and electrons in imperfect crystals.
Fundamental equations describing the X-ray and electron diffraction scattering in imperfect crystals have been derived in the form of the matrix Fredholm-Volterra integral equation of the second kind. A theoretical approach has been developed using the perfect-crystal Green function formalism. In contrast, another approach utilizes the wavefield eigenfunctions related to the diagonalized matrix propagators of the conventional Takagi-Taupin and Howie-Whelan equations. Using the Liouville-Neumann-type series formalism for building up the matrix Fredholm-Volterra integral equation solutions, the general resolvent function solutions of the X-ray and electron diffraction boundary-valued Cauchy problems have been obtained. Based on the resolvent-type solutions, the aim is to reveal the features of the diffraction scattering onto the crystal lattice defects, including the mechanisms of intra- and interbranch wave scattering in the strongly deformed regions in the vicinity of crystal lattice defect cores. Using the two-stage resolvent solution of the second order, this approach has been supported by straightforward calculation of the electron bright- and dark-field contrasts of an edge dislocation in a thick foil. The results obtained for the bright- and dark-field profiles of the edge dislocation are discussed and compared with analogous ones numerically calculated by Howie & Whelan [Proc. R. Soc. A (1962), 267, 206].
期刊介绍:
Acta Crystallographica Section A: Foundations and Advances publishes articles reporting advances in the theory and practice of all areas of crystallography in the broadest sense. As well as traditional crystallography, this includes nanocrystals, metacrystals, amorphous materials, quasicrystals, synchrotron and XFEL studies, coherent scattering, diffraction imaging, time-resolved studies and the structure of strain and defects in materials.
The journal has two parts, a rapid-publication Advances section and the traditional Foundations section. Articles for the Advances section are of particularly high value and impact. They receive expedited treatment and may be highlighted by an accompanying scientific commentary article and a press release. Further details are given in the November 2013 Editorial.
The central themes of the journal are, on the one hand, experimental and theoretical studies of the properties and arrangements of atoms, ions and molecules in condensed matter, periodic, quasiperiodic or amorphous, ideal or real, and, on the other, the theoretical and experimental aspects of the various methods to determine these properties and arrangements.