面向物联网应用的高轻载效率磁滞控制降压转换器与自适应时钟磁滞动态比较器

IF 1.9 3区 工程技术 Q3 ENGINEERING, ELECTRICAL & ELECTRONIC Microelectronics Journal Pub Date : 2024-07-16 DOI:10.1016/j.mejo.2024.106319
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引用次数: 0

摘要

为了提高轻负载时的转换效率,我们提出了一种带有自适应时钟滞后动态比较器(ACHDC)的滞后控制(HC)降压转换器。与传统的 HC 降压转换器相比,该转换器采用了一个带启用信号的比较器来取代连续导通比较器,从而显著降低了比较器的静态功耗。此外,该转换器的动态比较器采用了自适应时钟缩放电路 (ASC),使其能够在 1 μA 至 20 mA 的负载电流范围内实现较高的转换效率,同时将纹波电压的劣化降到最低。为了产生时钟信号,设计了一个基于漏电的振荡器,具有电容和电流双重调节功能。仿真结果表明,所提出的降压转换器实现了 94.83 % 的峰值效率,并在整个负载范围内保持了至少 86.47 % 的效率。
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A high-light-load-efficiency hysteresis-controlled buck converter with adaptively clocked hysteresis dynamic comparator for IoT applications

A hysteresis-controlled (HC) buck converter with an adaptively clocked hysteresis dynamic comparator (ACHDC) is proposed to improve the conversion efficiency at light load. In contrast to the conventional HC buck converter, a comparator with enabled signal is applied to replace the continuously-on comparator, resulting in significantly reduced static power consumption from the comparator. Additionally, the converter employs an adaptive clock scaling circuit (ACSC) for the dynamic comparator, enabling it to achieve high conversion efficiency across a load current range of 1 μA to 20 mA, with minimal deterioration in ripple voltage. To generate the clock signal, a leakage-based oscillator with dual regulation of capacitance and current is designed. Simulation results demonstrate that the proposed buck converter achieves a peak efficiency of 94.83 % and maintains an efficiency of at least 86.47 % over the entire load range.

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来源期刊
Microelectronics Journal
Microelectronics Journal 工程技术-工程:电子与电气
CiteScore
4.00
自引率
27.30%
发文量
222
审稿时长
43 days
期刊介绍: Published since 1969, the Microelectronics Journal is an international forum for the dissemination of research and applications of microelectronic systems, circuits, and emerging technologies. Papers published in the Microelectronics Journal have undergone peer review to ensure originality, relevance, and timeliness. The journal thus provides a worldwide, regular, and comprehensive update on microelectronic circuits and systems. The Microelectronics Journal invites papers describing significant research and applications in all of the areas listed below. Comprehensive review/survey papers covering recent developments will also be considered. The Microelectronics Journal covers circuits and systems. This topic includes but is not limited to: Analog, digital, mixed, and RF circuits and related design methodologies; Logic, architectural, and system level synthesis; Testing, design for testability, built-in self-test; Area, power, and thermal analysis and design; Mixed-domain simulation and design; Embedded systems; Non-von Neumann computing and related technologies and circuits; Design and test of high complexity systems integration; SoC, NoC, SIP, and NIP design and test; 3-D integration design and analysis; Emerging device technologies and circuits, such as FinFETs, SETs, spintronics, SFQ, MTJ, etc. Application aspects such as signal and image processing including circuits for cryptography, sensors, and actuators including sensor networks, reliability and quality issues, and economic models are also welcome.
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