{"title":"采用自愈技术的容错乘法器","authors":"Raghavendra Kumar Sakali , Noor Mahammad Sk","doi":"10.1016/j.microrel.2024.115458","DOIUrl":null,"url":null,"abstract":"<div><p>A Field Programmable Gate Array (FPGA) is a versatile device capable of reconfiguring the logic of circuits as required. FPGAs are widely utilized in developing critical systems for space applications, defence, and aviation due to their adaptability. To facilitate the operation of these systems, a multiplier circuit is often necessary. As mission-critical systems work in a radiation environment, which affects electronic devices, the FPGA is susceptible to radiation effects that may disrupt the functionality of the configured circuit. To address this, the multiplier needs a robust fault-tolerance mechanism. Evolvable-based hardware solutions hold promise for mitigating faults, but challenges related to scalability and error recovery time persist. To address these challenges, we introduce a novel approach: a self-healing multiplier equipped with a configuration bitstream generator (CBG). This innovation effectively mitigates scalability concerns through the use of an optimized Virtual Reconfigurable Circuit (VRC) multiplier design. Additionally, the proposed solution significantly improves error recovery time through CBG integration. Our primary focus in this work is on the intrinsic approach to achieving efficient performance. In the case of the 8 × 8 multiplier, the proposed work reduces 64.59% of LUT utilization and recovers the error in 29.25 ns using an intrinsic approach. In parallel, we employ a hybrid approach to provide a comparative analysis against the intrinsic approach, demonstrating its performance. We implemented the proposed methodology on the A3PE3000 FPGA platform and conducted a comparative analysis against the proposed hybrid approach and existing methods. The results validate the superior performance and efficiency of our work using the intrinsic approach.</p></div>","PeriodicalId":51131,"journal":{"name":"Microelectronics Reliability","volume":"160 ","pages":"Article 115458"},"PeriodicalIF":1.6000,"publicationDate":"2024-07-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Fault-tolerant multiplier using self-healing technique\",\"authors\":\"Raghavendra Kumar Sakali , Noor Mahammad Sk\",\"doi\":\"10.1016/j.microrel.2024.115458\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<div><p>A Field Programmable Gate Array (FPGA) is a versatile device capable of reconfiguring the logic of circuits as required. FPGAs are widely utilized in developing critical systems for space applications, defence, and aviation due to their adaptability. To facilitate the operation of these systems, a multiplier circuit is often necessary. As mission-critical systems work in a radiation environment, which affects electronic devices, the FPGA is susceptible to radiation effects that may disrupt the functionality of the configured circuit. To address this, the multiplier needs a robust fault-tolerance mechanism. Evolvable-based hardware solutions hold promise for mitigating faults, but challenges related to scalability and error recovery time persist. To address these challenges, we introduce a novel approach: a self-healing multiplier equipped with a configuration bitstream generator (CBG). This innovation effectively mitigates scalability concerns through the use of an optimized Virtual Reconfigurable Circuit (VRC) multiplier design. Additionally, the proposed solution significantly improves error recovery time through CBG integration. Our primary focus in this work is on the intrinsic approach to achieving efficient performance. In the case of the 8 × 8 multiplier, the proposed work reduces 64.59% of LUT utilization and recovers the error in 29.25 ns using an intrinsic approach. In parallel, we employ a hybrid approach to provide a comparative analysis against the intrinsic approach, demonstrating its performance. We implemented the proposed methodology on the A3PE3000 FPGA platform and conducted a comparative analysis against the proposed hybrid approach and existing methods. The results validate the superior performance and efficiency of our work using the intrinsic approach.</p></div>\",\"PeriodicalId\":51131,\"journal\":{\"name\":\"Microelectronics Reliability\",\"volume\":\"160 \",\"pages\":\"Article 115458\"},\"PeriodicalIF\":1.6000,\"publicationDate\":\"2024-07-26\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Microelectronics Reliability\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://www.sciencedirect.com/science/article/pii/S0026271424001380\",\"RegionNum\":4,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q3\",\"JCRName\":\"ENGINEERING, ELECTRICAL & ELECTRONIC\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Microelectronics Reliability","FirstCategoryId":"5","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S0026271424001380","RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
Fault-tolerant multiplier using self-healing technique
A Field Programmable Gate Array (FPGA) is a versatile device capable of reconfiguring the logic of circuits as required. FPGAs are widely utilized in developing critical systems for space applications, defence, and aviation due to their adaptability. To facilitate the operation of these systems, a multiplier circuit is often necessary. As mission-critical systems work in a radiation environment, which affects electronic devices, the FPGA is susceptible to radiation effects that may disrupt the functionality of the configured circuit. To address this, the multiplier needs a robust fault-tolerance mechanism. Evolvable-based hardware solutions hold promise for mitigating faults, but challenges related to scalability and error recovery time persist. To address these challenges, we introduce a novel approach: a self-healing multiplier equipped with a configuration bitstream generator (CBG). This innovation effectively mitigates scalability concerns through the use of an optimized Virtual Reconfigurable Circuit (VRC) multiplier design. Additionally, the proposed solution significantly improves error recovery time through CBG integration. Our primary focus in this work is on the intrinsic approach to achieving efficient performance. In the case of the 8 × 8 multiplier, the proposed work reduces 64.59% of LUT utilization and recovers the error in 29.25 ns using an intrinsic approach. In parallel, we employ a hybrid approach to provide a comparative analysis against the intrinsic approach, demonstrating its performance. We implemented the proposed methodology on the A3PE3000 FPGA platform and conducted a comparative analysis against the proposed hybrid approach and existing methods. The results validate the superior performance and efficiency of our work using the intrinsic approach.
期刊介绍:
Microelectronics Reliability, is dedicated to disseminating the latest research results and related information on the reliability of microelectronic devices, circuits and systems, from materials, process and manufacturing, to design, testing and operation. The coverage of the journal includes the following topics: measurement, understanding and analysis; evaluation and prediction; modelling and simulation; methodologies and mitigation. Papers which combine reliability with other important areas of microelectronics engineering, such as design, fabrication, integration, testing, and field operation will also be welcome, and practical papers reporting case studies in the field and specific application domains are particularly encouraged.
Most accepted papers will be published as Research Papers, describing significant advances and completed work. Papers reviewing important developing topics of general interest may be accepted for publication as Review Papers. Urgent communications of a more preliminary nature and short reports on completed practical work of current interest may be considered for publication as Research Notes. All contributions are subject to peer review by leading experts in the field.