在铁电 FinFET 跨栅上高效实现马哈拉诺比斯距离以检测离群点

IF 2 3区 工程技术 Q3 ENGINEERING, ELECTRICAL & ELECTRONIC IEEE Journal of the Electron Devices Society Pub Date : 2024-06-19 DOI:10.1109/JEDS.2024.3416441
Musaib Rafiq;Yogesh Singh Chauhan;Shubham Sahay
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引用次数: 0

摘要

新兴的人工智能(AIoT)领域的发展在很大程度上依赖于高质量多维数据的可用性。在这个大数据时代,大量数据被收集起来,主要用于人工智能/物联网算法和新兴应用。考虑到如此巨大的数据量,收集到的数据可能包含大量离群值,在利用这些数据进行数据挖掘或计算之前,必须先检测出离群值。因此,离群值检测技术(如 Mahalanobis 距离计算)最近大受欢迎。Mahalanobis 距离是欧氏距离的多元等价物,用于准确检测相关数据中的离群值,在故障识别、数据聚类、单类分类、信息安全、数据挖掘等领域得到广泛应用。然而,传统的基于 CMOS 的 Mahalanobis 距离计算方法体积庞大、能耗巨大。因此,迫切需要一种紧凑、节能的离群点检测技术,该技术可部署在包括无线传感器节点在内的人工智能物联网基元上,用于现场离群点检测和生成高质量数据。为此,我们在本文中首次提出了一种基于铁电 FinFET 的高效实现方法,利用 Mahalanobis 距离检测相关多元数据中的异常值。所提出的实现方法利用了两个铁电 FinFET 横条阵列来计算 Mahalanobis 距离,并使用新型的基于逆变器的阈值电路来检测流行的威斯康星州乳腺癌数据集中的异常值。我们实现的准确率为 94.1%,与软件实现的准确率相当,而能耗却很低(27.2 pJ)。
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Efficient Implementation of Mahalanobis Distance on Ferroelectric FinFET Crossbar for Outlier Detection
The developments in the nascent field of artificial-intelligence-of-things (AIoT) relies heavily on the availability of high-quality multi-dimensional data. A huge amount of data is being collected in this era of big data, predominantly for AI/ML algorithms and emerging applications. Considering such voluminous quantities, the collected data may contain a substantial number of outliers which must be detected before utilizing them for data mining or computations. Therefore, outlier detection techniques such as Mahalanobis distance computation have gained significant popularity recently. Mahalanobis distance, the multivariate equivalent of the Euclidean distance, is used to detect the outliers in the correlated data accurately and finds widespread application in fault identification, data clustering, singleclass classification, information security, data mining, etc. However, traditional CMOS-based approaches to compute Mahalanobis distance are bulky and consume a huge amount of energy. Therefore, there is an urgent need for a compact and energy-efficient implementation of an outlier detection technique which may be deployed on AIoT primitives, including wireless sensor nodes for in-situ outlier detection and generation of high-quality data. To this end, in this paper, for the first time, we have proposed an efficient Ferroelectric FinFET-based implementation for detecting outliers in correlated multivariate data using Mahalanobis distance. The proposed implementation utilizes two crossbar arrays of ferroelectric FinFETs to calculate the Mahalanobis distance and detect outliers in the popular Wisconsin breast cancer dataset using a novel inverter-based threshold circuit. Our implementation exhibits an accuracy of 94.1% which is comparable to the software implementations while consuming a significantly low energy (27.2 pJ).
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来源期刊
IEEE Journal of the Electron Devices Society
IEEE Journal of the Electron Devices Society Biochemistry, Genetics and Molecular Biology-Biotechnology
CiteScore
5.20
自引率
4.30%
发文量
124
审稿时长
9 weeks
期刊介绍: The IEEE Journal of the Electron Devices Society (J-EDS) is an open-access, fully electronic scientific journal publishing papers ranging from fundamental to applied research that are scientifically rigorous and relevant to electron devices. The J-EDS publishes original and significant contributions relating to the theory, modelling, design, performance, and reliability of electron and ion integrated circuit devices and interconnects, involving insulators, metals, organic materials, micro-plasmas, semiconductors, quantum-effect structures, vacuum devices, and emerging materials with applications in bioelectronics, biomedical electronics, computation, communications, displays, microelectromechanics, imaging, micro-actuators, nanodevices, optoelectronics, photovoltaics, power IC''s, and micro-sensors. Tutorial and review papers on these subjects are, also, published. And, occasionally special issues with a collection of papers on particular areas in more depth and breadth are, also, published. J-EDS publishes all papers that are judged to be technically valid and original.
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