氧化锌纳米粒子薄膜光学特性的光谱-椭偏研究

IF 1.8 4区材料科学 Q3 MATERIALS SCIENCE, MULTIDISCIPLINARY MRS Communications Pub Date : 2024-08-22 DOI:10.1557/s43579-024-00626-4

Khagendra P. Bhandari, Dhurba R. Sapkota, Balaji Ramanujam

{"title":"氧化锌纳米粒子薄膜光学特性的光谱-椭偏研究","authors":"Khagendra P. Bhandari, Dhurba R. Sapkota, Balaji Ramanujam","doi":"10.1557/s43579-024-00626-4","DOIUrl":null,"url":null,"abstract":"We described optical properties of zinc oxide (ZnO) nanoparticles determined by spectroscopic ellipsometry analysis from ex situ spectroscopic ellipsometry (ex situ SE) measurements made on nanocrystalline thin films over a spectral range of 0.734 to 4.00 eV. We determined the complex refractive index function, \\(\\widetilde{n}(\\omega )=n(\\omega )+i\\kappa (\\omega )\\), by fitting a layered parametric model to the ellipsometric measurements. We collected SE measurements at an incidence angle of 70°. We also determined absorption coefficient spectra using extinction coefficient, κ and wavelength, λ. The direct optical bandgap of the films was obtained as 3.2 eV using the ellipsometric method.<h3 data-test=\"abstract-sub-heading\">Graphical abstract</h3>","PeriodicalId":19016,"journal":{"name":"MRS Communications","volume":"58 1","pages":""},"PeriodicalIF":1.8000,"publicationDate":"2024-08-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Spectroscopic-ellipsometry study of the optical properties of ZnO nanoparticle thin films\",\"authors\":\"Khagendra P. Bhandari, Dhurba R. Sapkota, Balaji Ramanujam\",\"doi\":\"10.1557/s43579-024-00626-4\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"We described optical properties of zinc oxide (ZnO) nanoparticles determined by spectroscopic ellipsometry analysis from ex situ spectroscopic ellipsometry (ex situ SE) measurements made on nanocrystalline thin films over a spectral range of 0.734 to 4.00 eV. We determined the complex refractive index function, \\\\(\\\\widetilde{n}(\\\\omega )=n(\\\\omega )+i\\\\kappa (\\\\omega )\\\\), by fitting a layered parametric model to the ellipsometric measurements. We collected SE measurements at an incidence angle of 70°. We also determined absorption coefficient spectra using extinction coefficient, κ and wavelength, λ. The direct optical bandgap of the films was obtained as 3.2 eV using the ellipsometric method.<h3 data-test=\\\"abstract-sub-heading\\\">Graphical abstract</h3>\",\"PeriodicalId\":19016,\"journal\":{\"name\":\"MRS Communications\",\"volume\":\"58 1\",\"pages\":\"\"},\"PeriodicalIF\":1.8000,\"publicationDate\":\"2024-08-22\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"MRS Communications\",\"FirstCategoryId\":\"88\",\"ListUrlMain\":\"https://doi.org/10.1557/s43579-024-00626-4\",\"RegionNum\":4,\"RegionCategory\":\"材料科学\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q3\",\"JCRName\":\"MATERIALS SCIENCE, MULTIDISCIPLINARY\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"MRS Communications","FirstCategoryId":"88","ListUrlMain":"https://doi.org/10.1557/s43579-024-00626-4","RegionNum":4,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"MATERIALS SCIENCE, MULTIDISCIPLINARY","Score":null,"Total":0}

引用次数: 0

摘要

我们描述了通过原位光谱椭偏仪（ex situ SE）测量纳米晶体薄膜在 0.734 至 4.00 eV 光谱范围内的光谱椭偏仪分析确定的氧化锌（ZnO）纳米颗粒的光学特性。我们通过对椭偏测量结果拟合分层参数模型，确定了复折射率函数（\widetilde{n}(\omega )=n(\omega )+i\kappa (\omega )\ ）。我们收集了入射角为 70° 的 SE 测量值。我们还使用消光系数κ和波长λ测定了吸收系数光谱。使用椭偏方法得出薄膜的直接光带隙为 3.2 eV。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

摘要图片

查看原文

微信好友朋友圈 QQ好友复制链接

本刊更多论文

Spectroscopic-ellipsometry study of the optical properties of ZnO nanoparticle thin films

We described optical properties of zinc oxide (ZnO) nanoparticles determined by spectroscopic ellipsometry analysis from ex situ spectroscopic ellipsometry (ex situ SE) measurements made on nanocrystalline thin films over a spectral range of 0.734 to 4.00 eV. We determined the complex refractive index function, \(\widetilde{n}(\omega )=n(\omega )+i\kappa (\omega )\), by fitting a layered parametric model to the ellipsometric measurements. We collected SE measurements at an incidence angle of 70°. We also determined absorption coefficient spectra using extinction coefficient, κ and wavelength, λ. The direct optical bandgap of the films was obtained as 3.2 eV using the ellipsometric method.

Graphical abstract

求助全文

通过发布文献求助，成功后即可免费获取论文全文。去求助

来源期刊

MRS Communications MATERIALS SCIENCE, MULTIDISCIPLINARY-

CiteScore

2.60

自引率

10.50%

发文量

166

审稿时长

>12 weeks

期刊介绍： MRS Communications is a full-color, high-impact journal focused on rapid publication of completed research with broad appeal to the materials community. MRS Communications offers a rapid but rigorous peer-review process and time to publication. Leveraging its access to the far-reaching technical expertise of MRS members and leading materials researchers from around the world, the journal boasts an experienced and highly respected board of principal editors and reviewers.