通过嵌入式非均匀椭圆技术实现 DC-43.5 GHz 线键合和垂直通孔互连的三维封装系统

IF 2.3 3区 工程技术 Q2 ENGINEERING, ELECTRICAL & ELECTRONIC IEEE Transactions on Components, Packaging and Manufacturing Technology Pub Date : 2024-08-13 DOI:10.1109/TCPMT.2024.3442828
Pei Ge;Hao-Ran Zhu;Jia-Guo Lu
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摘要

本文通过嵌入式非均匀椭圆技术,为三维封装系统(SiP)提出了一种新型超宽键合线和垂直通孔互连技术。键合导线的垂直补偿结构由带有串联电感短通孔的椭圆形电容带状线构成。在垂直通孔互连中,椭圆槽被用作准同轴结构的七阶低通滤波器,它由多个接地孔包围的信号孔构成。通过逐渐改变椭圆结构的宽度,阻抗波动明显减小。在建立等效电路模型时,加入了相邻导线之间的耦合,从而可以准确分析导线绑定互连的传输行为。测量结果表明,在 dc-43.5 GHz 频率范围内,回波损耗优于 15 dB,插入损耗小于 1 dB。
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A DC-43.5 GHz Wire-Bonding and Vertical Via Interconnection by Embedded Nonuniform Elliptical Technique for 3-D System in Package
In this article, a novel ultrawide wire-bonding and vertical via interconnection are proposed for 3-D system in package (SiP) by embedded nonuniform elliptic technique. The vertical compensation structure of the bonding wires is constructed by an elliptic capacitive stripline with a series inductance short via. For vertical via interconnection, the elliptical slot is employed to act as a seventh-order low-pass filter with the quasi-coaxial structure, which is formed by the signal hole surrounded by several grounded holes. The impedance fluctuation is significantly reduced by gradually changing the width of the elliptic structure. The coupling between the adjacent wires is added to build the equivalent circuit model, which can accurately analyze the transmission behavior of the wire-bonding interconnection. From the measurement results, the return loss is better than 15 dB and the insertion loss is less than 1 dB within the frequency range of dc-43.5 GHz.
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来源期刊
IEEE Transactions on Components, Packaging and Manufacturing Technology
IEEE Transactions on Components, Packaging and Manufacturing Technology ENGINEERING, MANUFACTURING-ENGINEERING, ELECTRICAL & ELECTRONIC
CiteScore
4.70
自引率
13.60%
发文量
203
审稿时长
3 months
期刊介绍: IEEE Transactions on Components, Packaging, and Manufacturing Technology publishes research and application articles on modeling, design, building blocks, technical infrastructure, and analysis underpinning electronic, photonic and MEMS packaging, in addition to new developments in passive components, electrical contacts and connectors, thermal management, and device reliability; as well as the manufacture of electronics parts and assemblies, with broad coverage of design, factory modeling, assembly methods, quality, product robustness, and design-for-environment.
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