电子元件组装的进步:人工智能驱动的实时检测技术

IF 2.6 3区 工程技术 Q2 COMPUTER SCIENCE, INFORMATION SYSTEMS Electronics Pub Date : 2024-09-18 DOI:10.3390/electronics13183707
Eyal Weiss
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引用次数: 0

摘要

本研究提出了一种先进的方法,利用最先进的人工智能(AI)和深度学习技术,通过实时在线检测提高电子组装质量。其主要目标是确保符合严格的制造标准,特别是 IPC-A-610 和 IPC-J-STD-001。该系统利用拾放设备的现有基础设施,在装配过程中捕捉电子元件的高分辨率图像。这些图像由人工智能算法即时分析,能够检测出各种缺陷,包括损坏、腐蚀、伪造以及元件及其引线的结构异常。这种积极主动的方法改变了传统的被动质量保证方法,将实时缺陷检测和严格遵守行业标准整合到了组装流程中。该系统的准确率超过 99.5%,每个组件的处理速度约为 5 毫秒,使制造商能够及时发现并处理缺陷,从而显著提高制造质量和可靠性。该系统的实施利用了大数据分析技术,对超过十亿个组件进行分析,以完善检测算法,确保性能稳定。通过在缺陷升级之前预先防范和解决缺陷,该方法最大限度地减少了生产中断,提高了工作流程的效率,最终大大降低了成本。本文展示了多个组件缺陷案例研究,重点介绍了通过人工智能和深度学习识别出的各种类型的缺陷。这些案例与详细的性能指标相结合,为优化电子元件组装流程提供了见解,有助于提高生产效率和质量。
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Advancements in Electronic Component Assembly: Real-Time AI-Driven Inspection Techniques
This study presents an advanced methodology for improving electronic assembly quality through real-time, inline inspection utilizing state-of-the-art artificial intelligence (AI) and deep learning technologies. The primary goal is to ensure compliance with stringent manufacturing standards, notably IPC-A-610 and IPC-J-STD-001. Employing the existing infrastructure of pick-and-place machines, this system captures high-resolution images of electronic components during the assembly process. These images are analyzed instantly by AI algorithms capable of detecting a variety of defects, including damage, corrosion, counterfeit, and structural irregularities in components and their leads. This proactive approach shifts from conventional reactive quality assurance methods by integrating real-time defect detection and strict adherence to industry standards into the assembly process. With an accuracy rate exceeding 99.5% and processing speeds of about 5 milliseconds per component, this system enables manufacturers to identify and address defects promptly, thereby significantly enhancing manufacturing quality and reliability. The implementation leverages big data analytics, analyzing over a billion components to refine detection algorithms and ensure robust performance. By pre-empting and resolving defects before they escalate, the methodology minimizes production disruptions and fosters a more efficient workflow, ultimately resulting in considerable cost reductions. This paper showcases multiple case studies of component defects, highlighting the diverse types of defects identified through AI and deep learning. These examples, combined with detailed performance metrics, provide insights into optimizing electronic component assembly processes, contributing to elevated production efficiency and quality.
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来源期刊
Electronics
Electronics Computer Science-Computer Networks and Communications
CiteScore
1.10
自引率
10.30%
发文量
3515
审稿时长
16.71 days
期刊介绍: Electronics (ISSN 2079-9292; CODEN: ELECGJ) is an international, open access journal on the science of electronics and its applications published quarterly online by MDPI.
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