{"title":"电子元件组装的进步:人工智能驱动的实时检测技术","authors":"Eyal Weiss","doi":"10.3390/electronics13183707","DOIUrl":null,"url":null,"abstract":"This study presents an advanced methodology for improving electronic assembly quality through real-time, inline inspection utilizing state-of-the-art artificial intelligence (AI) and deep learning technologies. The primary goal is to ensure compliance with stringent manufacturing standards, notably IPC-A-610 and IPC-J-STD-001. Employing the existing infrastructure of pick-and-place machines, this system captures high-resolution images of electronic components during the assembly process. These images are analyzed instantly by AI algorithms capable of detecting a variety of defects, including damage, corrosion, counterfeit, and structural irregularities in components and their leads. This proactive approach shifts from conventional reactive quality assurance methods by integrating real-time defect detection and strict adherence to industry standards into the assembly process. With an accuracy rate exceeding 99.5% and processing speeds of about 5 milliseconds per component, this system enables manufacturers to identify and address defects promptly, thereby significantly enhancing manufacturing quality and reliability. The implementation leverages big data analytics, analyzing over a billion components to refine detection algorithms and ensure robust performance. By pre-empting and resolving defects before they escalate, the methodology minimizes production disruptions and fosters a more efficient workflow, ultimately resulting in considerable cost reductions. This paper showcases multiple case studies of component defects, highlighting the diverse types of defects identified through AI and deep learning. These examples, combined with detailed performance metrics, provide insights into optimizing electronic component assembly processes, contributing to elevated production efficiency and quality.","PeriodicalId":11646,"journal":{"name":"Electronics","volume":"11 1","pages":""},"PeriodicalIF":2.6000,"publicationDate":"2024-09-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Advancements in Electronic Component Assembly: Real-Time AI-Driven Inspection Techniques\",\"authors\":\"Eyal Weiss\",\"doi\":\"10.3390/electronics13183707\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This study presents an advanced methodology for improving electronic assembly quality through real-time, inline inspection utilizing state-of-the-art artificial intelligence (AI) and deep learning technologies. The primary goal is to ensure compliance with stringent manufacturing standards, notably IPC-A-610 and IPC-J-STD-001. Employing the existing infrastructure of pick-and-place machines, this system captures high-resolution images of electronic components during the assembly process. These images are analyzed instantly by AI algorithms capable of detecting a variety of defects, including damage, corrosion, counterfeit, and structural irregularities in components and their leads. This proactive approach shifts from conventional reactive quality assurance methods by integrating real-time defect detection and strict adherence to industry standards into the assembly process. With an accuracy rate exceeding 99.5% and processing speeds of about 5 milliseconds per component, this system enables manufacturers to identify and address defects promptly, thereby significantly enhancing manufacturing quality and reliability. The implementation leverages big data analytics, analyzing over a billion components to refine detection algorithms and ensure robust performance. By pre-empting and resolving defects before they escalate, the methodology minimizes production disruptions and fosters a more efficient workflow, ultimately resulting in considerable cost reductions. This paper showcases multiple case studies of component defects, highlighting the diverse types of defects identified through AI and deep learning. 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Advancements in Electronic Component Assembly: Real-Time AI-Driven Inspection Techniques
This study presents an advanced methodology for improving electronic assembly quality through real-time, inline inspection utilizing state-of-the-art artificial intelligence (AI) and deep learning technologies. The primary goal is to ensure compliance with stringent manufacturing standards, notably IPC-A-610 and IPC-J-STD-001. Employing the existing infrastructure of pick-and-place machines, this system captures high-resolution images of electronic components during the assembly process. These images are analyzed instantly by AI algorithms capable of detecting a variety of defects, including damage, corrosion, counterfeit, and structural irregularities in components and their leads. This proactive approach shifts from conventional reactive quality assurance methods by integrating real-time defect detection and strict adherence to industry standards into the assembly process. With an accuracy rate exceeding 99.5% and processing speeds of about 5 milliseconds per component, this system enables manufacturers to identify and address defects promptly, thereby significantly enhancing manufacturing quality and reliability. The implementation leverages big data analytics, analyzing over a billion components to refine detection algorithms and ensure robust performance. By pre-empting and resolving defects before they escalate, the methodology minimizes production disruptions and fosters a more efficient workflow, ultimately resulting in considerable cost reductions. This paper showcases multiple case studies of component defects, highlighting the diverse types of defects identified through AI and deep learning. These examples, combined with detailed performance metrics, provide insights into optimizing electronic component assembly processes, contributing to elevated production efficiency and quality.
ElectronicsComputer Science-Computer Networks and Communications
CiteScore
1.10
自引率
10.30%
发文量
3515
审稿时长
16.71 days
期刊介绍:
Electronics (ISSN 2079-9292; CODEN: ELECGJ) is an international, open access journal on the science of electronics and its applications published quarterly online by MDPI.