重新思考线材放电加工:用工程粗线提高性能

Akshyn Biman-Telang , Philip Koshy , Daniel Schulze Brock , Ugur Küpper , Andreas Klink , Tim Herrig , Thomas Bergs
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引用次数: 0

摘要

线材放电加工(WEDM)的广泛应用仍然受到切削率低的阻碍,这在很大程度上是由于线材失效造成的限制。因此,本研究探讨了使用比行业标准 0.25 毫米直径更粗的线材的影响。鉴于现代线切割机床的最大线径仅为 0.4 毫米,研究人员采用了数值和实验相结合的方法,计算出最佳线径,同时考虑到与较粗线相关的较高加工功率和较大切口宽度的竞争影响,并预测相应的切割率。这项研究为了解断丝的基本现象提供了新的视角,并强调了通过重新审查粗丝线切割来提高加工性能的重要前景。
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Rethinking wire electrical discharge machining: A case for engineering thick wires to enhance performance
The widespread application of wire electrical discharge machining (WEDM) continues to be impeded by its low cutting rate, which in large part stems from constraints related to wire failure. This research therefore explored the implications of utilizing wires thicker than the industry-standard 0.25 mm diameter wire. Given that modern WEDM machines are limited to a maximum wire diameter of only 0.4 mm, a combination of numerical and experimental approaches was adopted to compute the optimal wire diameter in consideration of the competing influences of higher machining power and larger kerf width associated with thicker wires, and to project the corresponding cutting rates. The research offers new insights into phenomena underlying wire break, and underscores the significant prospects towards enhancing process performance by re-examining WEDM in terms of thick wires.
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来源期刊
CiteScore
7.40
自引率
5.60%
发文量
177
审稿时长
46 days
期刊介绍: Precision Engineering - Journal of the International Societies for Precision Engineering and Nanotechnology is devoted to the multidisciplinary study and practice of high accuracy engineering, metrology, and manufacturing. The journal takes an integrated approach to all subjects related to research, design, manufacture, performance validation, and application of high precision machines, instruments, and components, including fundamental and applied research and development in manufacturing processes, fabrication technology, and advanced measurement science. The scope includes precision-engineered systems and supporting metrology over the full range of length scales, from atom-based nanotechnology and advanced lithographic technology to large-scale systems, including optical and radio telescopes and macrometrology.
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