{"title":"用于夏克-哈特曼传感器和偏转测量的带状形状重构","authors":"","doi":"10.1016/j.optlaseng.2024.108615","DOIUrl":null,"url":null,"abstract":"<div><div>Some metrological means, such as Shack-Hartmann, deflectometry sensors or fringe projection profilometry, measure the shape of an optical surface indirectly from slope measurements. Zonal shape reconstruction, a method to reconstruct shape with a high number of degrees of freedom, is used for all of these applications. It has risen in interest with the use of deflectometers for the acquisition of high resolution slope data for optical manufacturing, especially because shape reconstruction is limiting in terms of shape estimation error.</div><div>Zonal reconstruction methods all rely on the choice of a data formation model, a basis on which the shape will be decomposed, and an estimator. In this paper, we first study the canonical Fried and Southwell models of the literature and analyze their limitations. We show that modeling the slope measurement by a point-wise derivative as they both do can induce a bias on the shape estimation, and that the bases on which the shape is decomposed are imposed because of this assumption.</div><div>In the second part of this paper, we propose to build an unbiased model of the data formation, without constraints on the choice of the decomposition basis. We then compare these models to the canonical models of Fried and Southwell.</div><div>Lastly, we perform a regularized MAP reconstruction, and compare the performance in terms of total shape error of this method to the state of the art for the Southwell and Fried models, first by simulation, then on experimental data. We demonstrate that the suggested method outperforms the canonical models in terms of total shape reconstruction error on a deflectometry measurement of the high-frequency content of a freeform mirror.</div></div>","PeriodicalId":49719,"journal":{"name":"Optics and Lasers in Engineering","volume":null,"pages":null},"PeriodicalIF":3.5000,"publicationDate":"2024-10-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Zonal shape reconstruction for Shack-Hartmann sensors and deflectometry\",\"authors\":\"\",\"doi\":\"10.1016/j.optlaseng.2024.108615\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<div><div>Some metrological means, such as Shack-Hartmann, deflectometry sensors or fringe projection profilometry, measure the shape of an optical surface indirectly from slope measurements. Zonal shape reconstruction, a method to reconstruct shape with a high number of degrees of freedom, is used for all of these applications. It has risen in interest with the use of deflectometers for the acquisition of high resolution slope data for optical manufacturing, especially because shape reconstruction is limiting in terms of shape estimation error.</div><div>Zonal reconstruction methods all rely on the choice of a data formation model, a basis on which the shape will be decomposed, and an estimator. In this paper, we first study the canonical Fried and Southwell models of the literature and analyze their limitations. We show that modeling the slope measurement by a point-wise derivative as they both do can induce a bias on the shape estimation, and that the bases on which the shape is decomposed are imposed because of this assumption.</div><div>In the second part of this paper, we propose to build an unbiased model of the data formation, without constraints on the choice of the decomposition basis. We then compare these models to the canonical models of Fried and Southwell.</div><div>Lastly, we perform a regularized MAP reconstruction, and compare the performance in terms of total shape error of this method to the state of the art for the Southwell and Fried models, first by simulation, then on experimental data. We demonstrate that the suggested method outperforms the canonical models in terms of total shape reconstruction error on a deflectometry measurement of the high-frequency content of a freeform mirror.</div></div>\",\"PeriodicalId\":49719,\"journal\":{\"name\":\"Optics and Lasers in Engineering\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":3.5000,\"publicationDate\":\"2024-10-02\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Optics and Lasers in Engineering\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://www.sciencedirect.com/science/article/pii/S0143816624005931\",\"RegionNum\":2,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q2\",\"JCRName\":\"OPTICS\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Optics and Lasers in Engineering","FirstCategoryId":"5","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S0143816624005931","RegionNum":2,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"OPTICS","Score":null,"Total":0}
Zonal shape reconstruction for Shack-Hartmann sensors and deflectometry
Some metrological means, such as Shack-Hartmann, deflectometry sensors or fringe projection profilometry, measure the shape of an optical surface indirectly from slope measurements. Zonal shape reconstruction, a method to reconstruct shape with a high number of degrees of freedom, is used for all of these applications. It has risen in interest with the use of deflectometers for the acquisition of high resolution slope data for optical manufacturing, especially because shape reconstruction is limiting in terms of shape estimation error.
Zonal reconstruction methods all rely on the choice of a data formation model, a basis on which the shape will be decomposed, and an estimator. In this paper, we first study the canonical Fried and Southwell models of the literature and analyze their limitations. We show that modeling the slope measurement by a point-wise derivative as they both do can induce a bias on the shape estimation, and that the bases on which the shape is decomposed are imposed because of this assumption.
In the second part of this paper, we propose to build an unbiased model of the data formation, without constraints on the choice of the decomposition basis. We then compare these models to the canonical models of Fried and Southwell.
Lastly, we perform a regularized MAP reconstruction, and compare the performance in terms of total shape error of this method to the state of the art for the Southwell and Fried models, first by simulation, then on experimental data. We demonstrate that the suggested method outperforms the canonical models in terms of total shape reconstruction error on a deflectometry measurement of the high-frequency content of a freeform mirror.
期刊介绍:
Optics and Lasers in Engineering aims at providing an international forum for the interchange of information on the development of optical techniques and laser technology in engineering. Emphasis is placed on contributions targeted at the practical use of methods and devices, the development and enhancement of solutions and new theoretical concepts for experimental methods.
Optics and Lasers in Engineering reflects the main areas in which optical methods are being used and developed for an engineering environment. Manuscripts should offer clear evidence of novelty and significance. Papers focusing on parameter optimization or computational issues are not suitable. Similarly, papers focussed on an application rather than the optical method fall outside the journal''s scope. The scope of the journal is defined to include the following:
-Optical Metrology-
Optical Methods for 3D visualization and virtual engineering-
Optical Techniques for Microsystems-
Imaging, Microscopy and Adaptive Optics-
Computational Imaging-
Laser methods in manufacturing-
Integrated optical and photonic sensors-
Optics and Photonics in Life Science-
Hyperspectral and spectroscopic methods-
Infrared and Terahertz techniques