Cheng-Ling Tai , Jhen-De You , Jia-Jun Chen , Shu-Cheng Liang , Tsai-Fu Chung , Yo-Lun Yang , Seiichiro Ii , Takahito Ohmura , Xiaoyang Zheng , Chih-Yuan Chen , Jer-Ren Yang
{"title":"钴铬镍和钴铬镍硅 0.3 纳米柱变形机制的原位透射电子显微镜研究","authors":"Cheng-Ling Tai , Jhen-De You , Jia-Jun Chen , Shu-Cheng Liang , Tsai-Fu Chung , Yo-Lun Yang , Seiichiro Ii , Takahito Ohmura , Xiaoyang Zheng , Chih-Yuan Chen , Jer-Ren Yang","doi":"10.1016/j.scriptamat.2024.116405","DOIUrl":null,"url":null,"abstract":"<div><div>CoCrNi and CoCrNiSi<sub>0.3</sub> nanopillars exhibited distinct deformation behaviors under in-situ compression experiments with a strain rate of 2 × 10<sup>–3</sup> s<sup>-1</sup> in a transmission electron microscope. The former was mainly deformed through slip-dislocations and the formation of slip-bands with edges extending to the nanopillar's boundaries; in contrast, the latter was primarily deformed by twinning and partitioned by deformation nanotwins, with different variants intersecting each other to form closed nano-blocks. Si addition not only enhanced the solid solution strengthening effect but also facilitated the formation of nanotwins, resulting in a delayed first strain burst in the CoCrNiSi<sub>0.3</sub> nanopillar at a strain of 9.6 % with strength 39 % higher than that in CoCrNi at a strain of 7.1 % during the in-situ deformation. In addition, closed nano-blocks effectively strengthened the CoCrNiSi<sub>0.3</sub> nanopillar, which possessed strength 24 % higher than that of the CoCrNi nanopillar at the same strain of ∼20 %.</div></div>","PeriodicalId":423,"journal":{"name":"Scripta Materialia","volume":"255 ","pages":"Article 116405"},"PeriodicalIF":5.3000,"publicationDate":"2024-10-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"In-situ transmission electron microscopy investigation of the deformation mechanism in CoCrNi and CoCrNiSi0.3 nanopillars\",\"authors\":\"Cheng-Ling Tai , Jhen-De You , Jia-Jun Chen , Shu-Cheng Liang , Tsai-Fu Chung , Yo-Lun Yang , Seiichiro Ii , Takahito Ohmura , Xiaoyang Zheng , Chih-Yuan Chen , Jer-Ren Yang\",\"doi\":\"10.1016/j.scriptamat.2024.116405\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<div><div>CoCrNi and CoCrNiSi<sub>0.3</sub> nanopillars exhibited distinct deformation behaviors under in-situ compression experiments with a strain rate of 2 × 10<sup>–3</sup> s<sup>-1</sup> in a transmission electron microscope. The former was mainly deformed through slip-dislocations and the formation of slip-bands with edges extending to the nanopillar's boundaries; in contrast, the latter was primarily deformed by twinning and partitioned by deformation nanotwins, with different variants intersecting each other to form closed nano-blocks. Si addition not only enhanced the solid solution strengthening effect but also facilitated the formation of nanotwins, resulting in a delayed first strain burst in the CoCrNiSi<sub>0.3</sub> nanopillar at a strain of 9.6 % with strength 39 % higher than that in CoCrNi at a strain of 7.1 % during the in-situ deformation. In addition, closed nano-blocks effectively strengthened the CoCrNiSi<sub>0.3</sub> nanopillar, which possessed strength 24 % higher than that of the CoCrNi nanopillar at the same strain of ∼20 %.</div></div>\",\"PeriodicalId\":423,\"journal\":{\"name\":\"Scripta Materialia\",\"volume\":\"255 \",\"pages\":\"Article 116405\"},\"PeriodicalIF\":5.3000,\"publicationDate\":\"2024-10-15\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Scripta Materialia\",\"FirstCategoryId\":\"88\",\"ListUrlMain\":\"https://www.sciencedirect.com/science/article/pii/S1359646224004408\",\"RegionNum\":2,\"RegionCategory\":\"材料科学\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q2\",\"JCRName\":\"MATERIALS SCIENCE, MULTIDISCIPLINARY\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Scripta Materialia","FirstCategoryId":"88","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S1359646224004408","RegionNum":2,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"MATERIALS SCIENCE, MULTIDISCIPLINARY","Score":null,"Total":0}
In-situ transmission electron microscopy investigation of the deformation mechanism in CoCrNi and CoCrNiSi0.3 nanopillars
CoCrNi and CoCrNiSi0.3 nanopillars exhibited distinct deformation behaviors under in-situ compression experiments with a strain rate of 2 × 10–3 s-1 in a transmission electron microscope. The former was mainly deformed through slip-dislocations and the formation of slip-bands with edges extending to the nanopillar's boundaries; in contrast, the latter was primarily deformed by twinning and partitioned by deformation nanotwins, with different variants intersecting each other to form closed nano-blocks. Si addition not only enhanced the solid solution strengthening effect but also facilitated the formation of nanotwins, resulting in a delayed first strain burst in the CoCrNiSi0.3 nanopillar at a strain of 9.6 % with strength 39 % higher than that in CoCrNi at a strain of 7.1 % during the in-situ deformation. In addition, closed nano-blocks effectively strengthened the CoCrNiSi0.3 nanopillar, which possessed strength 24 % higher than that of the CoCrNi nanopillar at the same strain of ∼20 %.
期刊介绍:
Scripta Materialia is a LETTERS journal of Acta Materialia, providing a forum for the rapid publication of short communications on the relationship between the structure and the properties of inorganic materials. The emphasis is on originality rather than incremental research. Short reports on the development of materials with novel or substantially improved properties are also welcomed. Emphasis is on either the functional or mechanical behavior of metals, ceramics and semiconductors at all length scales.