通过耦合数值分析优化介电层参数,提高数字微流控芯片中液滴和颗粒的操控性

IF 3.5 2区 物理与天体物理 Q2 PHYSICS, APPLIED Applied Physics Letters Pub Date : 2024-10-17 DOI:10.1063/5.0225853
Yanfeng Zhao, Menghua Liu, Xinyi Dong, Jiaxin Liu, Hen-Wei Huang, Qing Shi, Qiang Huang, Huaping Wang
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引用次数: 0

摘要

数字微流控芯片(DMC)具有灵活操控液滴和颗粒的能力,这对于药物筛选和临床诊断等生物医学应用来说意义重大。作为 DMC 的重要组成部分,介电层的关键物理参数(介电常数和厚度)直接决定了电压分布,从而显著影响操纵性能。为了优化操纵性能,在设计 DMC 时必须对介电层参数进行模拟研究。现有的模拟方法可以评估介电层参数对液滴操纵的影响,但在分析液滴内颗粒的操纵时会遇到固有的挑战。在此,我们提出了一种通用的数值分析方法,可同时分析介电层参数对液滴和颗粒操控的影响,从而优化介电层参数,提高 DMC 的操控性能。首先,利用电磁场理论求解不同介电层参数对应的电压分布。随后,根据虚功原理,利用电压分布数据计算液滴和粒子的驱动力。最后,通过比较不同介电层参数下的驱动力,确定最佳介电层参数,以提高 DMC 的操纵性能。实验结果表明,液滴和粒子的加速度与模拟的驱动力趋势一致,从而验证了我们的数值分析方法。我们预计,我们的方法将能为介电层参数的优化提供理论指导,从而在更复杂的 DMC 设计中获得理想的操纵性能。
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Optimization of the dielectric layer parameters through coupled numerical analysis to enhance droplet and particle manipulation in digital microfluidic chips
Digital microfluidic chips (DMCs) have shown the ability to flexibly manipulate droplets and particles, which is meaningful for biomedical applications in drug screening and clinical diagnostics. As a critical component of DMCs, the dielectric layer, with its key physical parameters (permittivity and thickness), directly determines the voltage distribution, thereby significantly affecting the manipulation performance. To optimize manipulation performance, simulation studies on dielectric layer parameters are essential during the DMC design. Existing simulation methods can evaluate the effect of dielectric layer parameters on droplet manipulation but encounter inherent challenges when analyzing the manipulation of particles within droplets. Here, we propose a versatile numerical analysis approach that can simultaneously analyze the effect of dielectric layer parameters on both droplet and particle manipulation, thereby optimizing the dielectric layer parameters to enhance the DMC manipulation performance. Initially, the voltage distributions corresponding to different sets of dielectric layer parameters are solved using electromagnetic field theory. Subsequently, the voltage distribution data are used to calculate the droplet and particle driving forces based on the principle of virtual work. Finally, by comparing the driving forces across different sets of dielectric layer parameters, the optimal dielectric layer parameters are determined to enhance the DMC manipulation performance. Experimental results demonstrate that the droplet and particle accelerations align with the simulated driving force trends, thereby validating our numerical analysis method. We anticipate that our method will be able to provide theoretical guidance for the optimization of dielectric layer parameters to obtain a desirable manipulation performance in more complex DMC designs.
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来源期刊
Applied Physics Letters
Applied Physics Letters 物理-物理:应用
CiteScore
6.40
自引率
10.00%
发文量
1821
审稿时长
1.6 months
期刊介绍: Applied Physics Letters (APL) features concise, up-to-date reports on significant new findings in applied physics. Emphasizing rapid dissemination of key data and new physical insights, APL offers prompt publication of new experimental and theoretical papers reporting applications of physics phenomena to all branches of science, engineering, and modern technology. In addition to regular articles, the journal also publishes invited Fast Track, Perspectives, and in-depth Editorials which report on cutting-edge areas in applied physics. APL Perspectives are forward-looking invited letters which highlight recent developments or discoveries. Emphasis is placed on very recent developments, potentially disruptive technologies, open questions and possible solutions. They also include a mini-roadmap detailing where the community should direct efforts in order for the phenomena to be viable for application and the challenges associated with meeting that performance threshold. Perspectives are characterized by personal viewpoints and opinions of recognized experts in the field. Fast Track articles are invited original research articles that report results that are particularly novel and important or provide a significant advancement in an emerging field. Because of the urgency and scientific importance of the work, the peer review process is accelerated. If, during the review process, it becomes apparent that the paper does not meet the Fast Track criterion, it is returned to a normal track.
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