{"title":"基于深度学习和贝叶斯算法的玻璃通孔激光钻孔参数优化","authors":"Yuhang Ouyang;Dongyang Hou;Ting Lv;Fang Dong;Sheng Liu;Jianhui Zhao","doi":"10.1109/TCPMT.2024.3446510","DOIUrl":null,"url":null,"abstract":"In the semiconductor industry, especially in the manufacturing of through-glass vias (TGVs), there is an increasing need to improve the quality and efficiency of manufacturing processes. To address the challenges such as lack of efficiency, requiring substantial manual labor, and falling short in precision of traditional methods in meeting high standards for TGV manufacturing, the approach that combines deep learning and optimization techniques was introduced to achieve automatic quality assessment and refine laser drilling parameters for TGVs manufacturing. We have developed a residual U-Net model with an accuracy of up to 87.9% by training high-resolution scanning electron microscope (SEM) images of TGVs for automatic assessment of TGVs quality, closely matching the assessments made by human experts. We used Bayesian optimization to iteratively adjust the laser drilling parameters that are crucial for TGVs manufacturing, and the quality scores obtained by the residual U-Net model enhanced by 13.2% after 50 iterations, which confirms the effectiveness of the integration of U-Net architecture with Bayesian optimization in achieving optimal manufacturing results.","PeriodicalId":13085,"journal":{"name":"IEEE Transactions on Components, Packaging and Manufacturing Technology","volume":"14 9","pages":"1680-1691"},"PeriodicalIF":2.3000,"publicationDate":"2024-08-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Parameter Optimization of Laser Drilling for Through-Glass Vias Based on Deep Learning and Bayesian Algorithm\",\"authors\":\"Yuhang Ouyang;Dongyang Hou;Ting Lv;Fang Dong;Sheng Liu;Jianhui Zhao\",\"doi\":\"10.1109/TCPMT.2024.3446510\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In the semiconductor industry, especially in the manufacturing of through-glass vias (TGVs), there is an increasing need to improve the quality and efficiency of manufacturing processes. To address the challenges such as lack of efficiency, requiring substantial manual labor, and falling short in precision of traditional methods in meeting high standards for TGV manufacturing, the approach that combines deep learning and optimization techniques was introduced to achieve automatic quality assessment and refine laser drilling parameters for TGVs manufacturing. We have developed a residual U-Net model with an accuracy of up to 87.9% by training high-resolution scanning electron microscope (SEM) images of TGVs for automatic assessment of TGVs quality, closely matching the assessments made by human experts. We used Bayesian optimization to iteratively adjust the laser drilling parameters that are crucial for TGVs manufacturing, and the quality scores obtained by the residual U-Net model enhanced by 13.2% after 50 iterations, which confirms the effectiveness of the integration of U-Net architecture with Bayesian optimization in achieving optimal manufacturing results.\",\"PeriodicalId\":13085,\"journal\":{\"name\":\"IEEE Transactions on Components, Packaging and Manufacturing Technology\",\"volume\":\"14 9\",\"pages\":\"1680-1691\"},\"PeriodicalIF\":2.3000,\"publicationDate\":\"2024-08-20\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE Transactions on Components, Packaging and Manufacturing Technology\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://ieeexplore.ieee.org/document/10640121/\",\"RegionNum\":3,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q2\",\"JCRName\":\"ENGINEERING, ELECTRICAL & ELECTRONIC\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Transactions on Components, Packaging and Manufacturing Technology","FirstCategoryId":"5","ListUrlMain":"https://ieeexplore.ieee.org/document/10640121/","RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0
摘要
在半导体行业,尤其是在玻璃通孔(TGV)的制造过程中,对提高制造过程的质量和效率的需求与日俱增。针对 TGV 制造过程中存在的效率低下、需要大量人工、传统方法精度不高等问题,我们引入了深度学习和优化技术相结合的方法,以实现自动质量评估,并完善 TGV 制造过程中的激光钻孔参数。我们通过训练 TGV 的高分辨率扫描电子显微镜(SEM)图像,开发了一个残差 U-Net 模型,用于自动评估 TGV 的质量,准确率高达 87.9%,与人类专家的评估结果非常接近。我们使用贝叶斯优化方法迭代调整对 TGV 制造至关重要的激光钻孔参数,经过 50 次迭代后,残余 U-Net 模型获得的质量分数提高了 13.2%,这证实了 U-Net 架构与贝叶斯优化方法的整合在实现最佳制造结果方面的有效性。
Parameter Optimization of Laser Drilling for Through-Glass Vias Based on Deep Learning and Bayesian Algorithm
In the semiconductor industry, especially in the manufacturing of through-glass vias (TGVs), there is an increasing need to improve the quality and efficiency of manufacturing processes. To address the challenges such as lack of efficiency, requiring substantial manual labor, and falling short in precision of traditional methods in meeting high standards for TGV manufacturing, the approach that combines deep learning and optimization techniques was introduced to achieve automatic quality assessment and refine laser drilling parameters for TGVs manufacturing. We have developed a residual U-Net model with an accuracy of up to 87.9% by training high-resolution scanning electron microscope (SEM) images of TGVs for automatic assessment of TGVs quality, closely matching the assessments made by human experts. We used Bayesian optimization to iteratively adjust the laser drilling parameters that are crucial for TGVs manufacturing, and the quality scores obtained by the residual U-Net model enhanced by 13.2% after 50 iterations, which confirms the effectiveness of the integration of U-Net architecture with Bayesian optimization in achieving optimal manufacturing results.
期刊介绍:
IEEE Transactions on Components, Packaging, and Manufacturing Technology publishes research and application articles on modeling, design, building blocks, technical infrastructure, and analysis underpinning electronic, photonic and MEMS packaging, in addition to new developments in passive components, electrical contacts and connectors, thermal management, and device reliability; as well as the manufacture of electronics parts and assemblies, with broad coverage of design, factory modeling, assembly methods, quality, product robustness, and design-for-environment.