通过电沉积氧化锌纳米粒子增强硅纳米线的光电性能,实现高效二极管性能

IF 2.8 3区 材料科学 Q3 CHEMISTRY, PHYSICAL Silicon Pub Date : 2024-09-27 DOI:10.1007/s12633-024-03156-9
Lamia Bouaziz, Amina Lamouchi, Mokhtar Karyaoui, Radhouane Chtourou
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引用次数: 0

摘要

本文首次在银辅助化学蚀刻法制备的硅纳米线(SiNWs)上通过电化学沉积成功合成了氧化锌纳米粒子(ZnO NPs)。在制备的纳米线上预先涂覆了氧化锌种子层,以便利用电化学沉积从水溶液中初始化出均匀生长的氧化锌纳米粒子。扫描电镜图像显示,硅纳米线上均匀分布着致密的氧化锌纳米粒子。X 射线衍射图样表明,电沉积的 ZnO 纳米粒子具有六方菱面体结构。电流-电压特性表明,氧化锌纳米粒子明显改善了二极管的各项参数,如理想系数(n)、串联电阻(\({R}_{s}\))、能垒(\({\varphi }_{b}\))和饱和电流(\({I}_{s}\))。因此,与纯 SiNWs 结构相比,ZnO NPs/SiNWs 结构的整流性能提高了 2.7 倍。这些异质结构的饱和电流值({I}_{s}\)和串联电阻值({R}_{s}\)都有所下降,表明结质量有所改善,这可能是由于悬空键和表面缺陷的减少。值得注意的是,氧化锌纳米粒子 @SiNWs 使少数载流子寿命从 9.11 \(\mu s\) 延长到 14.89 \(\mu s\) ,从而降低了表面重组活动,进一步揭示了氧化锌纳米粒子的高效表面钝化作用。纯 SiNWs 和 SiNWs/ZnO NPs 的良好抗反射能力分别高达 10%和 15%,而裸硅的抗反射能力仅为 40%。基于这些发现,SiNWs/ZnO NPs 可被视为光电器件、光伏和纳米电子学的潜在候选材料。
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Enhanced Optoelectronic and Electrical Properties of Silicon Nanowires by Electrodeposited ZnO Nanoparticles for Efficient Diode Performance

In this paper, Zinc Oxide nanoparticles (ZnO NPs) have been successfully synthesized for the first time by electrochemical deposition on silicon nanowires (SiNWs) produced using silver-assisted chemical etching method. The as-prepared nanowires were pre-coated with ZnO seed layer to initialize the uniform growth of ZnO nanoparticles from aqueous solutions using the electrochemical deposition. The SEM images showed a homogenous distribution of dense ZnO nanoparticles on silicon nanowires. X-ray diffraction pattern indicated that the electrodeposited ZnO NPs have hexagonal wurtzite structure. Current–voltage characteristics pointed that ZnO NPs significantly improved the diode parameters such as ideality factor (n), series resistance (\({R}_{s}\)), energy barrier (\({\varphi }_{b}\)) and saturation current (\({I}_{s}\)). As a result, a rectifying behavior of the ZnO NPs/SiNWs structure has been exhibited by a factor of 2.7 compared to pure SiNWs structures. The values of the saturation current \({I}_{s}\) and the series resistance \({R}_{s}\) of these heterostructures decrease indicating an improvement in junction quality which can be due to the reduction of dangling bonds and surface defects. Significantly, ZnO nanoparticles @SiNWs increased the minority carrier lifetime from 9.11 \(\mu s\) to 14.89 \(\mu s\) and consequently reduced the surface recombination activities, further revealing the efficient surface passivation role of ZnO nanoparticles. Good anti-reflectance abilities up to 10% and 15% are observed for pure SiNWs and SiNWs/ZnO NPs, respectively, as compared to 40% for bare Silicon. Based on these findings, SiNWs/ZnO NPs can be considered as potential candidate for optoelectronic devices, photovoltaics and nanoelectronics.

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来源期刊
Silicon
Silicon CHEMISTRY, PHYSICAL-MATERIALS SCIENCE, MULTIDISCIPLINARY
CiteScore
5.90
自引率
20.60%
发文量
685
审稿时长
>12 weeks
期刊介绍: The journal Silicon is intended to serve all those involved in studying the role of silicon as an enabling element in materials science. There are no restrictions on disciplinary boundaries provided the focus is on silicon-based materials or adds significantly to the understanding of such materials. Accordingly, such contributions are welcome in the areas of inorganic and organic chemistry, physics, biology, engineering, nanoscience, environmental science, electronics and optoelectronics, and modeling and theory. Relevant silicon-based materials include, but are not limited to, semiconductors, polymers, composites, ceramics, glasses, coatings, resins, composites, small molecules, and thin films.
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