掺杂Ta5+的LLZO电解质及其结构和电学特性对固态储能应用的影响

IF 2.8 4区 工程技术 Q2 ENGINEERING, ELECTRICAL & ELECTRONIC Journal of Materials Science: Materials in Electronics Pub Date : 2025-02-13 DOI:10.1007/s10854-025-14362-5
V. Janakiraman, Max Savio, Abdullah N. Alodhayb, Muthumareeswaran Muthuramamoorthy, M. Ammal Dhanalakshmi, M. Vimalan, Mathivanan Durai, K. Ganesh Kumar
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引用次数: 0

摘要

电解质Li7La3Zr2O12 (LLZO)已成为固态储能应用的一个有前途的竞争者。本文采用固相反应技术合成了掺ta的Li7La3Zr2O12 (LLZO: xTa5+)粉体。用于制造球团的粉末经过不同时间的退火。研究了这一过程对LLZO: xTa5+结构和电学特性的影响。采用高分辨率透射电子显微镜(HRTEM)和选择衍射光区(SAED)分别分析了烧结粉末的微观结构特征。LLZO的HRTEM图像表明,烧结后的xTa5+粉体表面晶粒分布均匀,结构良好。x射线光电子能谱(XPS)结果有力地证明了合成电解质中存在Ta、O、Zr、Li和La。循环伏安法结果证实,在相同电位水平下,0.15 M.W.% Ta5+掺杂LLZO的阳极电流密度(±5 mA cm2)高于纯掺杂LLZO(±2.5 mA cm2)和0.25 M.W.%掺杂LLZO(±3.5 mA cm2)。电化学阻抗谱(EIS)显示较低的R(电阻),而Nyquist图的倾斜直线表示Warburg阻抗,表明电极的高导电性。研究了掺0.15 M.W.% Ta5+的LLZO球团在频率变化和不同温度条件下的介电常数及其相应损耗。
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Impact of LLZO electrolytes doped with Ta5+ and their structural and electrical characteristics for solid-state energy storage applications

The electrolyte Li7La3Zr2O12 (LLZO) has emerged as a promising contender for solid-state energy storage applications. The present work uses a solid-state reaction technique to synthesize Ta-doped Li7La3Zr2O12 (LLZO: xTa5+) powder. The powder used to make the pellets is annealed for varying lengths of time. The impact of this process on the structural and electrical characteristics of LLZO: xTa5+ is thoroughly examined. High-resolution transmission electron microscopy (HRTEM) and selected area of diffracted light (SAED) are used to analyze the microstructural characteristics of the sintered powder, respectively. HRTEM image of LLZO indicates that after sintering, the xTa5+ powder has uniformly distributed, well-structured grains across the surface. The X-ray photoelectron spectroscopy (XPS) spectra results provide strong evidence for the existence of Ta, O, Zr, Li, and La in the synthesized electrolyte. The cyclic voltammetry results validate that 0.15 M.W.% Ta5+-doped LLZO gives a higher anodic current density (± 5 mA cm2) than pure (± 2.5 mA cm2) and 0.25 M.W.% (± 3.5 mA cm2) dopant percentage for the same potential levels. The electrochemical impedance spectroscopy (EIS) shows the lower R (resistance), whereas slanting straight line of the Nyquist plot indicates the Warburg impedance, signifying the high conductivity of the electrode. The dielectric constant and its corresponding loss, with respect to change in frequency and different temperature conditions were investigated for 0.15 M.W.% Ta5+-doped LLZO pellet.

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来源期刊
Journal of Materials Science: Materials in Electronics
Journal of Materials Science: Materials in Electronics 工程技术-材料科学:综合
CiteScore
5.00
自引率
7.10%
发文量
1931
审稿时长
2 months
期刊介绍: The Journal of Materials Science: Materials in Electronics is an established refereed companion to the Journal of Materials Science. It publishes papers on materials and their applications in modern electronics, covering the ground between fundamental science, such as semiconductor physics, and work concerned specifically with applications. It explores the growth and preparation of new materials, as well as their processing, fabrication, bonding and encapsulation, together with the reliability, failure analysis, quality assurance and characterization related to the whole range of applications in electronics. The Journal presents papers in newly developing fields such as low dimensional structures and devices, optoelectronics including III-V compounds, glasses and linear/non-linear crystal materials and lasers, high Tc superconductors, conducting polymers, thick film materials and new contact technologies, as well as the established electronics device and circuit materials.
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