用降噪方法提高电子全息术相位估计的精度

IF 1.8 4区 工程技术 Microscopy Pub Date : 2019-11-01 DOI:10.1093/jmicro/dfz115
Yoshihiro Midoh;Koji Nakamae
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引用次数: 8

摘要

我们试图通过一种降噪方法来提高电子全息术中低电子剂量水平下干涉条纹相位估计的极限。在本文中,我们重点讨论了将其应用于电子束敏感和未知样本的无监督方法,并概述了在图像处理中广泛使用的去噪方法,如维纳滤波器、全变分去噪、非局部均值滤波器和小波阈值化。我们将迄今为止研究的小波隐马尔可夫模型(WHMM)去噪与其他传统的降噪方法进行了比较。我们使用无噪声和目标全息图(噪声或去噪全息图)之间的峰值信噪比以及条纹的真实相位和离散傅立叶变换相位估计器测量的相位之间的均方根误差(RMSE)来评估每种方法的去噪性能。通过使用各种降噪方法,我们展示了用于模拟和实验数据的降噪全息图,然后讨论了从这些降噪全息图中获得的评估指标。从实验结果可以看出,对于有噪声的模拟全息图,WHMM去噪可以将条纹相位的RMSE降低到约1/4.5,并且对于各种图像质量的观测全息图具有稳定良好的降噪性能。
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Accuracy improvement of phase estimation in electron holography using noise reduction methods
We try to improve the limit of the phase estimation of the interference fringe at low electron dose levels in electron holography by a noise reduction method. In this paper, we focus on unsupervised approaches to apply it to electron beam-sensitive and unknown samples and describe an overview of denoising methods used widely in image processing, such as wiener filter, total variation denoising, nonlocal mean filters and wavelet thresholding. We compare the wavelet hidden Markov model (WHMM) denoising that we have studied so far with the other conventional noise reduction methods. We evaluate the denoise performance of each method using the peak signal-to-noise ratio between noise-free and the target holograms (noisy or denoised holograms) and the root mean-square error (RMSE) between the true phase of the fringe and the measured phase by the discrete Fourier transform phase estimator. We show the denoised holograms for simulation and experimental data by using each noise reduction method and then discuss evaluation indexes obtained from these denoised holograms. From experimental results, it can be seen that the WHMM denoising can reduce the RMSE of fringe phase to about 1/4.5 for noisy simulation holograms and it has stable and good performance for noise reduction of observed holograms with various image qualities.
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来源期刊
Microscopy
Microscopy 工程技术-显微镜技术
自引率
11.10%
发文量
0
审稿时长
>12 weeks
期刊介绍: Microscopy, previously Journal of Electron Microscopy, promotes research combined with any type of microscopy techniques, applied in life and material sciences. Microscopy is the official journal of the Japanese Society of Microscopy.
期刊最新文献
In This Issue Scanning ion-conductance microscopy with a double-barreled nanopipette for topographic imaging of charged chromosomes Operando observation of magnetism in HDD writing heads by spin-polarized scanning electron microscopy Deep convolutional neural network image processing method providing improved signal-to-noise ratios in electron holography Electron transfer in LiMn1.5Ni0.5O4 during charging studied with soft X-ray spectrometry
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