{"title":"二碲化钼双栅极MOSFET的低频噪声性能","authors":"M. Muthu Manjula, R. Ramesh","doi":"10.1007/s10825-023-02074-0","DOIUrl":null,"url":null,"abstract":"<div><p>This work investigates the low-frequency noise performance of a 2H-type monolayer/bilayer molybdenum ditelluride (MoTe<sub>2</sub>) double-gate MOSFET. A hybrid simulation technique involving both QuantumWise ATK and Sentaurus TCAD tools has been used to simulate the device characteristics. First, density functional theory (DFT) has been used to simulate the electrical characteristics of monolayer and bilayer 2H–MoTe<sub>2</sub>. The parameters (bandgap and effective mass, mobility etc.) obtained using the atomistic simulator tool are exported into Sentaurus TCAD to simulate the drain current characteristics. We have used the kinetic velocity model and quantum model to account for the ballistic mobility and quantum effects in the device. The noise simulation for the bilayer MoTe<sub>2</sub> is computed using the impedance field method. Noise parameters such as noise power spectral density (<i>S</i><sub>ID</sub>) as a function of frequency and bias, and noise figure have also been simulated.</p></div>","PeriodicalId":620,"journal":{"name":"Journal of Computational Electronics","volume":"22 5","pages":"1433 - 1442"},"PeriodicalIF":2.2000,"publicationDate":"2023-07-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://link.springer.com/content/pdf/10.1007/s10825-023-02074-0.pdf","citationCount":"0","resultStr":"{\"title\":\"Low-frequency noise performance of a molybdenum ditelluride double-gate MOSFET\",\"authors\":\"M. Muthu Manjula, R. Ramesh\",\"doi\":\"10.1007/s10825-023-02074-0\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<div><p>This work investigates the low-frequency noise performance of a 2H-type monolayer/bilayer molybdenum ditelluride (MoTe<sub>2</sub>) double-gate MOSFET. A hybrid simulation technique involving both QuantumWise ATK and Sentaurus TCAD tools has been used to simulate the device characteristics. First, density functional theory (DFT) has been used to simulate the electrical characteristics of monolayer and bilayer 2H–MoTe<sub>2</sub>. The parameters (bandgap and effective mass, mobility etc.) obtained using the atomistic simulator tool are exported into Sentaurus TCAD to simulate the drain current characteristics. We have used the kinetic velocity model and quantum model to account for the ballistic mobility and quantum effects in the device. The noise simulation for the bilayer MoTe<sub>2</sub> is computed using the impedance field method. Noise parameters such as noise power spectral density (<i>S</i><sub>ID</sub>) as a function of frequency and bias, and noise figure have also been simulated.</p></div>\",\"PeriodicalId\":620,\"journal\":{\"name\":\"Journal of Computational Electronics\",\"volume\":\"22 5\",\"pages\":\"1433 - 1442\"},\"PeriodicalIF\":2.2000,\"publicationDate\":\"2023-07-22\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"https://link.springer.com/content/pdf/10.1007/s10825-023-02074-0.pdf\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Journal of Computational Electronics\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://link.springer.com/article/10.1007/s10825-023-02074-0\",\"RegionNum\":4,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q3\",\"JCRName\":\"ENGINEERING, ELECTRICAL & ELECTRONIC\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Computational Electronics","FirstCategoryId":"5","ListUrlMain":"https://link.springer.com/article/10.1007/s10825-023-02074-0","RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
Low-frequency noise performance of a molybdenum ditelluride double-gate MOSFET
This work investigates the low-frequency noise performance of a 2H-type monolayer/bilayer molybdenum ditelluride (MoTe2) double-gate MOSFET. A hybrid simulation technique involving both QuantumWise ATK and Sentaurus TCAD tools has been used to simulate the device characteristics. First, density functional theory (DFT) has been used to simulate the electrical characteristics of monolayer and bilayer 2H–MoTe2. The parameters (bandgap and effective mass, mobility etc.) obtained using the atomistic simulator tool are exported into Sentaurus TCAD to simulate the drain current characteristics. We have used the kinetic velocity model and quantum model to account for the ballistic mobility and quantum effects in the device. The noise simulation for the bilayer MoTe2 is computed using the impedance field method. Noise parameters such as noise power spectral density (SID) as a function of frequency and bias, and noise figure have also been simulated.
期刊介绍:
he Journal of Computational Electronics brings together research on all aspects of modeling and simulation of modern electronics. This includes optical, electronic, mechanical, and quantum mechanical aspects, as well as research on the underlying mathematical algorithms and computational details. The related areas of energy conversion/storage and of molecular and biological systems, in which the thrust is on the charge transport, electronic, mechanical, and optical properties, are also covered.
In particular, we encourage manuscripts dealing with device simulation; with optical and optoelectronic systems and photonics; with energy storage (e.g. batteries, fuel cells) and harvesting (e.g. photovoltaic), with simulation of circuits, VLSI layout, logic and architecture (based on, for example, CMOS devices, quantum-cellular automata, QBITs, or single-electron transistors); with electromagnetic simulations (such as microwave electronics and components); or with molecular and biological systems. However, in all these cases, the submitted manuscripts should explicitly address the electronic properties of the relevant systems, materials, or devices and/or present novel contributions to the physical models, computational strategies, or numerical algorithms.