光谱椭偏仪从10到700 K

IF 2.3 Q2 OPTICS Advanced Optical Technologies Pub Date : 2022-06-07 DOI:10.1515/aot-2022-0016
S. Zollner, F. Abadizaman, C. Emminger, N. Samarasingha
{"title":"光谱椭偏仪从10到700 K","authors":"S. Zollner, F. Abadizaman, C. Emminger, N. Samarasingha","doi":"10.1515/aot-2022-0016","DOIUrl":null,"url":null,"abstract":"Abstract The temperature dependence of the optical constants of materials (refractive index, absorption and extinction coefficients, and dielectric function) can be determined with spectroscopic ellipsometry over a broad range of temperatures and photon energies or wavelengths. Such results have practical value, for example for applications of optical materials at cryogenic or elevated temperatures. The temperature dependence of optical gaps and their broadenings also provides insight into the scattering of electrons and holes with other quasiparticles, such as phonons or magnons. This review presents a detailed discussion of the experimental considerations for temperature-dependent ellipsometry and selected results for insulators, semiconductors, and metals in the infrared to ultraviolet spectral regions.","PeriodicalId":46010,"journal":{"name":"Advanced Optical Technologies","volume":null,"pages":null},"PeriodicalIF":2.3000,"publicationDate":"2022-06-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"6","resultStr":"{\"title\":\"Spectroscopic ellipsometry from 10 to 700 K\",\"authors\":\"S. Zollner, F. Abadizaman, C. Emminger, N. Samarasingha\",\"doi\":\"10.1515/aot-2022-0016\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Abstract The temperature dependence of the optical constants of materials (refractive index, absorption and extinction coefficients, and dielectric function) can be determined with spectroscopic ellipsometry over a broad range of temperatures and photon energies or wavelengths. Such results have practical value, for example for applications of optical materials at cryogenic or elevated temperatures. The temperature dependence of optical gaps and their broadenings also provides insight into the scattering of electrons and holes with other quasiparticles, such as phonons or magnons. This review presents a detailed discussion of the experimental considerations for temperature-dependent ellipsometry and selected results for insulators, semiconductors, and metals in the infrared to ultraviolet spectral regions.\",\"PeriodicalId\":46010,\"journal\":{\"name\":\"Advanced Optical Technologies\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":2.3000,\"publicationDate\":\"2022-06-07\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"6\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Advanced Optical Technologies\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1515/aot-2022-0016\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q2\",\"JCRName\":\"OPTICS\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Advanced Optical Technologies","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1515/aot-2022-0016","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"OPTICS","Score":null,"Total":0}
引用次数: 6

摘要

材料的光学常数(折射率、吸收和消光系数以及介电函数)的温度依赖性可以用光谱椭偏法在很宽的温度和光子能量或波长范围内确定。这样的结果具有实用价值,例如在低温或高温下光学材料的应用。光隙及其加宽的温度依赖性也为电子和空穴与其他准粒子(如声子或磁振子)的散射提供了洞见。本文详细讨论了温度相关椭偏仪的实验考虑因素,以及在红外到紫外光谱区域对绝缘体、半导体和金属的选择结果。
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Spectroscopic ellipsometry from 10 to 700 K
Abstract The temperature dependence of the optical constants of materials (refractive index, absorption and extinction coefficients, and dielectric function) can be determined with spectroscopic ellipsometry over a broad range of temperatures and photon energies or wavelengths. Such results have practical value, for example for applications of optical materials at cryogenic or elevated temperatures. The temperature dependence of optical gaps and their broadenings also provides insight into the scattering of electrons and holes with other quasiparticles, such as phonons or magnons. This review presents a detailed discussion of the experimental considerations for temperature-dependent ellipsometry and selected results for insulators, semiconductors, and metals in the infrared to ultraviolet spectral regions.
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来源期刊
CiteScore
4.40
自引率
0.00%
发文量
23
期刊介绍: Advanced Optical Technologies is a strictly peer-reviewed scientific journal. The major aim of Advanced Optical Technologies is to publish recent progress in the fields of optical design, optical engineering, and optical manufacturing. Advanced Optical Technologies has a main focus on applied research and addresses scientists as well as experts in industrial research and development. Advanced Optical Technologies partners with the European Optical Society (EOS). All its 4.500+ members have free online access to the journal through their EOS member account. Topics: Optical design, Lithography, Opto-mechanical engineering, Illumination and lighting technology, Precision fabrication, Image sensor devices, Optical materials (polymer based, inorganic, crystalline/amorphous), Optical instruments in life science (biology, medicine, laboratories), Optical metrology, Optics in aerospace/defense, Simulation, interdisciplinary, Optics for astronomy, Standards, Consumer optics, Optical coatings.
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