{"title":"机器学习作为分类电子层析重建的工具","authors":"Lech Staniewicz, Paul A. Midgley","doi":"10.1186/s40679-015-0010-x","DOIUrl":null,"url":null,"abstract":"<p>Electron tomographic reconstructions often contain artefacts from sources such as noise in the projections and a “missing wedge” of projection angles which can hamper quantitative analysis. We present a machine-learning approach using freely available software for analysing imperfect reconstructions to be used in place of the more traditional thresholding based on grey-level technique and show that a properly trained image classifier can achieve manual levels of accuracy even on heavily artefacted data, though if multiple reconstructions are being processed, a separate classifier will need to be trained on each reconstruction for maximum accuracy.</p>","PeriodicalId":460,"journal":{"name":"Advanced Structural and Chemical Imaging","volume":"1 1","pages":""},"PeriodicalIF":3.5600,"publicationDate":"2015-08-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1186/s40679-015-0010-x","citationCount":"21","resultStr":"{\"title\":\"Machine learning as a tool for classifying electron tomographic reconstructions\",\"authors\":\"Lech Staniewicz, Paul A. Midgley\",\"doi\":\"10.1186/s40679-015-0010-x\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<p>Electron tomographic reconstructions often contain artefacts from sources such as noise in the projections and a “missing wedge” of projection angles which can hamper quantitative analysis. We present a machine-learning approach using freely available software for analysing imperfect reconstructions to be used in place of the more traditional thresholding based on grey-level technique and show that a properly trained image classifier can achieve manual levels of accuracy even on heavily artefacted data, though if multiple reconstructions are being processed, a separate classifier will need to be trained on each reconstruction for maximum accuracy.</p>\",\"PeriodicalId\":460,\"journal\":{\"name\":\"Advanced Structural and Chemical Imaging\",\"volume\":\"1 1\",\"pages\":\"\"},\"PeriodicalIF\":3.5600,\"publicationDate\":\"2015-08-05\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"https://sci-hub-pdf.com/10.1186/s40679-015-0010-x\",\"citationCount\":\"21\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Advanced Structural and Chemical Imaging\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://link.springer.com/article/10.1186/s40679-015-0010-x\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q1\",\"JCRName\":\"Medicine\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Advanced Structural and Chemical Imaging","FirstCategoryId":"1085","ListUrlMain":"https://link.springer.com/article/10.1186/s40679-015-0010-x","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"Medicine","Score":null,"Total":0}
Machine learning as a tool for classifying electron tomographic reconstructions
Electron tomographic reconstructions often contain artefacts from sources such as noise in the projections and a “missing wedge” of projection angles which can hamper quantitative analysis. We present a machine-learning approach using freely available software for analysing imperfect reconstructions to be used in place of the more traditional thresholding based on grey-level technique and show that a properly trained image classifier can achieve manual levels of accuracy even on heavily artefacted data, though if multiple reconstructions are being processed, a separate classifier will need to be trained on each reconstruction for maximum accuracy.