无铅焊点的剪切和疲劳性能:建模和微观结构分析

IF 2.2 4区 工程技术 Q3 ENGINEERING, ELECTRICAL & ELECTRONIC Journal of Electronic Packaging Pub Date : 2022-08-24 DOI:10.1115/1.4055318
Xin Wei, M. Belhadi, S. Hamasha, Ali Alahmer, R. Zhao, B. Prorok, N. Sakib
{"title":"无铅焊点的剪切和疲劳性能:建模和微观结构分析","authors":"Xin Wei, M. Belhadi, S. Hamasha, Ali Alahmer, R. Zhao, B. Prorok, N. Sakib","doi":"10.1115/1.4055318","DOIUrl":null,"url":null,"abstract":"\n The reliability of SAC-based solder alloys has been extensively investigated after the prohibition of lead in the electronics industry owing to their toxicity. Low-temperature solder (LTS) alloys have recently received considerable attention because of their low cost and reduced defects in complex assemblies. The shear and fatigue properties of individual solder joints were tested using an Instron micromechanical testing system in this research. Two novel solder alloys (Sn-58Bi-0.5Sb-0.15Ni and Sn-42Bi) with low melting temperatures were examined and compared with Sn-3.5Ag and Sn-3.0Ag-0.8Cu-3.0Bi. The surface finish was electroless nickel-immersion gold (ENIG) during the test. Shear testing was conducted at three strain rates, and the shear strength of each solder alloy was measured. A constant strain rate was used for the cyclic fatigue experiments. The fatigue life of each alloy was determined for various stress amplitudes. The failure mechanism in shear and fatigue tests were characterized using scanning electron microscopy/energy-dispersive spectroscopy (SEM/EDS). The results revealed that Sn-3.0Ag-0.8Cu-3.0Bi had superior shear and fatigue properties compared to other alloys, but was more susceptible to brittle failure. The shear strain rate affected the failure modes of Sn-3.0Ag-0.8Cu-3.0Bi, Sn-58Bi-0.5Sb-0.15Ni, and Sn-42Bi; however, Sn-3.5Ag was found to be insensitive. Several failure modes were detected for Sn-3.5Ag in both shear strength and fatigue tests.","PeriodicalId":15663,"journal":{"name":"Journal of Electronic Packaging","volume":" ","pages":""},"PeriodicalIF":2.2000,"publicationDate":"2022-08-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"13","resultStr":"{\"title\":\"Shear and Fatigue Properties of Lead-Free Solder Joints: Modeling and Microstructure Analysis\",\"authors\":\"Xin Wei, M. Belhadi, S. Hamasha, Ali Alahmer, R. Zhao, B. Prorok, N. Sakib\",\"doi\":\"10.1115/1.4055318\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\\n The reliability of SAC-based solder alloys has been extensively investigated after the prohibition of lead in the electronics industry owing to their toxicity. Low-temperature solder (LTS) alloys have recently received considerable attention because of their low cost and reduced defects in complex assemblies. The shear and fatigue properties of individual solder joints were tested using an Instron micromechanical testing system in this research. Two novel solder alloys (Sn-58Bi-0.5Sb-0.15Ni and Sn-42Bi) with low melting temperatures were examined and compared with Sn-3.5Ag and Sn-3.0Ag-0.8Cu-3.0Bi. The surface finish was electroless nickel-immersion gold (ENIG) during the test. Shear testing was conducted at three strain rates, and the shear strength of each solder alloy was measured. A constant strain rate was used for the cyclic fatigue experiments. The fatigue life of each alloy was determined for various stress amplitudes. The failure mechanism in shear and fatigue tests were characterized using scanning electron microscopy/energy-dispersive spectroscopy (SEM/EDS). The results revealed that Sn-3.0Ag-0.8Cu-3.0Bi had superior shear and fatigue properties compared to other alloys, but was more susceptible to brittle failure. The shear strain rate affected the failure modes of Sn-3.0Ag-0.8Cu-3.0Bi, Sn-58Bi-0.5Sb-0.15Ni, and Sn-42Bi; however, Sn-3.5Ag was found to be insensitive. Several failure modes were detected for Sn-3.5Ag in both shear strength and fatigue tests.\",\"PeriodicalId\":15663,\"journal\":{\"name\":\"Journal of Electronic Packaging\",\"volume\":\" \",\"pages\":\"\"},\"PeriodicalIF\":2.2000,\"publicationDate\":\"2022-08-24\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"13\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Journal of Electronic Packaging\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://doi.org/10.1115/1.4055318\",\"RegionNum\":4,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q3\",\"JCRName\":\"ENGINEERING, ELECTRICAL & ELECTRONIC\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Electronic Packaging","FirstCategoryId":"5","ListUrlMain":"https://doi.org/10.1115/1.4055318","RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 13

摘要

在电子工业中禁用铅后,由于其毒性,sac基焊料合金的可靠性得到了广泛的研究。低温焊料(LTS)合金因其低成本和减少复杂组件中的缺陷而受到广泛关注。采用Instron微力学测试系统对单个焊点的剪切和疲劳性能进行了测试。研究了两种新型低温钎料合金Sn-58Bi-0.5Sb-0.15Ni和Sn-42Bi,并与Sn-3.5Ag和Sn-3.0Ag-0.8Cu-3.0Bi进行了比较。在测试过程中,表面光洁度为化学镀镍浸金(ENIG)。在三种应变速率下进行了剪切试验,并测量了每种焊料合金的剪切强度。采用恒应变速率进行循环疲劳试验。测定了各合金在不同应力幅值下的疲劳寿命。利用扫描电镜/能谱分析(SEM/EDS)对剪切和疲劳试验中的破坏机理进行了表征。结果表明:Sn-3.0Ag-0.8Cu-3.0Bi合金具有较好的剪切性能和疲劳性能,但更易发生脆性破坏;剪切应变速率影响Sn-3.0Ag-0.8Cu-3.0Bi、Sn-58Bi-0.5Sb-0.15Ni和Sn-42Bi的破坏模式;而Sn-3.5Ag则不敏感。Sn-3.5Ag在抗剪强度和疲劳试验中检测到多种破坏模式。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
Shear and Fatigue Properties of Lead-Free Solder Joints: Modeling and Microstructure Analysis
The reliability of SAC-based solder alloys has been extensively investigated after the prohibition of lead in the electronics industry owing to their toxicity. Low-temperature solder (LTS) alloys have recently received considerable attention because of their low cost and reduced defects in complex assemblies. The shear and fatigue properties of individual solder joints were tested using an Instron micromechanical testing system in this research. Two novel solder alloys (Sn-58Bi-0.5Sb-0.15Ni and Sn-42Bi) with low melting temperatures were examined and compared with Sn-3.5Ag and Sn-3.0Ag-0.8Cu-3.0Bi. The surface finish was electroless nickel-immersion gold (ENIG) during the test. Shear testing was conducted at three strain rates, and the shear strength of each solder alloy was measured. A constant strain rate was used for the cyclic fatigue experiments. The fatigue life of each alloy was determined for various stress amplitudes. The failure mechanism in shear and fatigue tests were characterized using scanning electron microscopy/energy-dispersive spectroscopy (SEM/EDS). The results revealed that Sn-3.0Ag-0.8Cu-3.0Bi had superior shear and fatigue properties compared to other alloys, but was more susceptible to brittle failure. The shear strain rate affected the failure modes of Sn-3.0Ag-0.8Cu-3.0Bi, Sn-58Bi-0.5Sb-0.15Ni, and Sn-42Bi; however, Sn-3.5Ag was found to be insensitive. Several failure modes were detected for Sn-3.5Ag in both shear strength and fatigue tests.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
Journal of Electronic Packaging
Journal of Electronic Packaging 工程技术-工程:电子与电气
CiteScore
4.90
自引率
6.20%
发文量
44
审稿时长
3 months
期刊介绍: The Journal of Electronic Packaging publishes papers that use experimental and theoretical (analytical and computer-aided) methods, approaches, and techniques to address and solve various mechanical, materials, and reliability problems encountered in the analysis, design, manufacturing, testing, and operation of electronic and photonics components, devices, and systems. Scope: Microsystems packaging; Systems integration; Flexible electronics; Materials with nano structures and in general small scale systems.
期刊最新文献
Simultaneous Characterization of Both Ctes and Thermal Warpages of Flip-Chip Packages with a Cap Using Strain Gauges Research Status and Progress On Non-Destructive Testing Methods for Defect Inspection of Microelectronic Packaging Effects of Thermal-Moisture Coupled Field On Delamination Behavior of Electronic Packaging Heat Dissipation Design Based On Topology Optimization And Auxiliary Materials Optimal Design of Thermal Cycling Reliability For PBGA Assembly via FEM and Taguchi Method
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1