SS2-3低温扫描隧道显微镜的前沿与展望

IF 1.5 4区 工程技术 Q3 MICROSCOPY Microscopy Pub Date : 2019-11-01 DOI:10.1093/jmicro/dfz068
K. Iwaya
{"title":"SS2-3低温扫描隧道显微镜的前沿与展望","authors":"K. Iwaya","doi":"10.1093/jmicro/dfz068","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":48655,"journal":{"name":"Microscopy","volume":" ","pages":""},"PeriodicalIF":1.5000,"publicationDate":"2019-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1093/jmicro/dfz068","citationCount":"0","resultStr":"{\"title\":\"SS2-3 Frontier of Low-Temperature Scanning Tunnelling Microscopy and Future Perspective\",\"authors\":\"K. Iwaya\",\"doi\":\"10.1093/jmicro/dfz068\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\",\"PeriodicalId\":48655,\"journal\":{\"name\":\"Microscopy\",\"volume\":\" \",\"pages\":\"\"},\"PeriodicalIF\":1.5000,\"publicationDate\":\"2019-11-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"https://sci-hub-pdf.com/10.1093/jmicro/dfz068\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Microscopy\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://doi.org/10.1093/jmicro/dfz068\",\"RegionNum\":4,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q3\",\"JCRName\":\"MICROSCOPY\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Microscopy","FirstCategoryId":"5","ListUrlMain":"https://doi.org/10.1093/jmicro/dfz068","RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"MICROSCOPY","Score":null,"Total":0}
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SS2-3 Frontier of Low-Temperature Scanning Tunnelling Microscopy and Future Perspective
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来源期刊
Microscopy
Microscopy Physics and Astronomy-Instrumentation
CiteScore
3.30
自引率
11.10%
发文量
76
期刊介绍: Microscopy, previously Journal of Electron Microscopy, promotes research combined with any type of microscopy techniques, applied in life and material sciences. Microscopy is the official journal of the Japanese Society of Microscopy.
期刊最新文献
In This Issue Real-time scanning electron microscopy of unfixed tissue in the solution using a deformable and electron-transmissive film Atomic-Resolution STEM Image Denoising by Total Variation Regularization. Super-Resolution Reconstruction Based on BM3D and Compressed Sensing. Reliable Electrochemical Setup for in situ Observations with an Atmospheric SEM.
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