利用持久同源性对不同非晶态透射电子显微镜图像进行分类

IF 1.5 4区 工程技术 Q3 MICROSCOPY Microscopy Pub Date : 2022-02-16 DOI:10.1093/jmicro/dfac008
Fumihiko Uesugi, M. Ishii
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引用次数: 1

摘要

摘要利用透射电子显微镜(TEM)分辨非晶态是困难的。我们使用持久同源性来区分TEM图像上的不同非晶态,这是一种采用同源性概念并专注于“孔”的数学分析技术。采用经典的分子动力学模拟方法,建立了不同非晶态即非晶态和液态的结构模型。利用所制备的非晶态和液态,用多层切片法模拟了几种离焦条件下的TEM图像,并计算了它们的持久图。最后,采用逻辑回归和支持向量分类机器学习算法进行判别。因此,我们发现非晶相和液相的区分率在85%以上。由于TEM图像的对比度取决于样品厚度、焦距、透镜像差等,因此无法对径向分布函数进行分类;然而,持续的同源性可以在较宽的聚焦范围内区分不同的非晶态。
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Classification for transmission electron microscope images from different amorphous states using persistent homology
Abstract It is difficult to discriminate the amorphous state using a transmission electron microscope (TEM). We discriminated different amorphous states on TEM images using persistent homology, which is a mathematical analysis technique that employs the homology concept and focuses on ‘holes’. The structural models of the different amorphous states, that is, amorphous and liquid states, were created using classical molecular dynamic simulation. TEM images in several defocus conditions were simulated by the multi-slice method using the created amorphous and liquid states, and their persistent diagrams were calculated. Finally, logistic regression and support vector classification machine learning algorithms were applied for discrimination. Consequently, we found that the amorphous and liquid phases can be discriminated by more than 85%. Because the contrast of TEM images depends on sample thickness, focus, lens aberration, etc., radial distribution function cannot be classified; however, the persistent homology can discriminate different amorphous states in a wide focus range.
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来源期刊
Microscopy
Microscopy Physics and Astronomy-Instrumentation
CiteScore
3.30
自引率
11.10%
发文量
76
期刊介绍: Microscopy, previously Journal of Electron Microscopy, promotes research combined with any type of microscopy techniques, applied in life and material sciences. Microscopy is the official journal of the Japanese Society of Microscopy.
期刊最新文献
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