{"title":"基于高分辨率STEM图像微小阳离子位移测量的KA-2结构分析","authors":"S. Kobayashi","doi":"10.1093/jmicro/dfz044","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":48655,"journal":{"name":"Microscopy","volume":" ","pages":""},"PeriodicalIF":1.5000,"publicationDate":"2019-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1093/jmicro/dfz044","citationCount":"0","resultStr":"{\"title\":\"KA-2 Structural Analysis Based on Measurements of Slight Cation Displacements from High Resolution STEM Images\",\"authors\":\"S. Kobayashi\",\"doi\":\"10.1093/jmicro/dfz044\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\",\"PeriodicalId\":48655,\"journal\":{\"name\":\"Microscopy\",\"volume\":\" \",\"pages\":\"\"},\"PeriodicalIF\":1.5000,\"publicationDate\":\"2019-11-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"https://sci-hub-pdf.com/10.1093/jmicro/dfz044\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Microscopy\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://doi.org/10.1093/jmicro/dfz044\",\"RegionNum\":4,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q3\",\"JCRName\":\"MICROSCOPY\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Microscopy","FirstCategoryId":"5","ListUrlMain":"https://doi.org/10.1093/jmicro/dfz044","RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"MICROSCOPY","Score":null,"Total":0}
期刊介绍:
Microscopy, previously Journal of Electron Microscopy, promotes research combined with any type of microscopy techniques, applied in life and material sciences. Microscopy is the official journal of the Japanese Society of Microscopy.