pH值对ZnO纳米结构的结构、形态和传感性能的影响

IF 1.2 4区 材料科学 Q4 MATERIALS SCIENCE, MULTIDISCIPLINARY Chalcogenide Letters Pub Date : 2023-01-01 DOI:10.15251/cl.2023.201.33
A. Zaidi, K. TiwariA., R. R. Awasthi, K. Dubey
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引用次数: 0

摘要

本研究采用溶胶-凝胶旋涂技术制备了不同pH值的ZnO薄膜。采用不同的表征技术研究了前驱体溶液的pH值对ZnO纳米结构的晶体结构、形态和湿度传感性能的影响。用粉末X射线衍射(PXRD)技术对其晶体结构和相分析进行了研究。PXRD图谱清楚地表明ZnO薄膜具有六方纤锌矿晶体结构。使用Scherer公式计算了ZnO薄膜的平均晶粒尺寸,发现其为~24nm至~30nm。计算了ZnO薄膜在不同pH值8和11下的微应变(a)和(c),结果分别为7.59和0.1017;分别为7.57、0.1094。扫描电子显微镜(SEM)图像描绘了直径范围为80至95nm的球形纳米结构的形成,其分布在整个表面上。原子力显微镜(AFM)图像还显示球形纳米结构均匀分布在整个表面上,直径范围为75至80nm。还发现,将pH值从8增加到11改变了晶粒和晶界。从8到11的pH值制备的ZnO薄膜的湿度传感性能分别在8.37MΩ/%RH到12.25MΩ/%RH
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Effect of pH values on the structural, morphological and sensing properties of ZnO nanostructure
In the present investigation ZnO thin films have been prepared by sol-gel spin coating technique with different pH values. The effect of pH values of precursor solution on the crystal structural, morphological and humidity sensing properties of ZnO nanostructures have been investigated using different characterization technique. The crystal structure and phase analysis has been examined by powder X-ray diffraction (PXRD) technique. The PXRD pattern clearly revealed the ZnO thin films have hexagonal wurtzite crystal structure. The average crystallite size of ZnO thin films have been calculated using Scherer formula and found to be ~24 nm to ~30 nm. The microstrain (ɛa) and (ɛc) of ZnO thin films for different pH values 8 and 11, have been calculated and found to be 7.59, 0.1017; 7.57, 0.1094 respectively. The scanning electron microscopy (SEM) image depicts the formation of spherical nanostructurewith diameter range 80 to 95 nm distributed throughout the surface. The atomic force microscopy (AFM) image also shows the spherical nanostructureconsistently distributed throughout the surface with diameter range 75 to 80 nm.It was also found that increasing the pH values from 8 to 11 modified the grains and grains boundary. The humidity sensing properties of ZnO thin films prepared from pH values of 8 to 11 and found to be lower hysteresis loss, less aging effect and good sensitivity in the range of 8.37 MΩ/%RH to 12.25 MΩ/%RH respectively
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来源期刊
Chalcogenide Letters
Chalcogenide Letters MATERIALS SCIENCE, MULTIDISCIPLINARY-PHYSICS, APPLIED
CiteScore
1.80
自引率
20.00%
发文量
86
审稿时长
1 months
期刊介绍: Chalcogenide Letters (CHL) has the aim to publish rapidly papers in chalcogenide field of research and appears with twelve issues per year. The journal is open to letters, short communications and breakings news inserted as Short Notes, in the field of chalcogenide materials either amorphous or crystalline. Short papers in structure, properties and applications, as well as those covering special properties in nano-structured chalcogenides are admitted.
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