空间应用印刷电路板高密度互连技术评价

M. Cauwe, B. Vandevelde, Chinmay Nawghane, Marnix Van De Slyeke, E. Bosman, J. Verhegge, Alexia Coulon, S. Heltzel
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引用次数: 2

摘要

高密度互连(HDI)印刷电路板和相关组件对于使太空项目受益于现代集成电路(如现场可编程门阵列、数字信号处理器和应用处理器)不断增加的复杂性和功能至关重要。对功能的不断增长的需求转化为更高的信号速度以及越来越多的输入/输出(I/O)。为了限制整体封装尺寸,减小了元件的接触焊盘间距。大量I/O与减小间距的组合对PCB提出了额外的要求,需要使用激光钻孔的微孔、高纵横比的核心过孔以及小的磁道宽度和间距。尽管相关的先进制造工艺已广泛应用于商业、汽车、医疗和军事应用,但协调这些能力进步与太空可靠性要求仍然是一个挑战。考虑了两类HDI技术:两级交错微孔(基本HDI)和(最多)三级堆叠微孔(复杂HDI)。本文介绍了根据ECSS-Q-ST-70-60C对HDI基本技术的鉴定。在1.0毫米的螺距下,该技术成功通过了所有测试。在间距为.8mm的情况下,在互连应力测试和导电阳极丝测试过程中会遇到故障。这些故障为更新HDI PCB的设计规则提供了基础。
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High-Density Interconnect Technology Assessment of Printed Circuit Boards for Space Applications
High-density interconnect (HDI) printed circuit boards (PCBs) and associated assemblies are essential to allow space projects to benefit from the ever increasing complexity and functionality of modern integrated circuits such as field-programmable gate arrays, digital signal processors and application processors. Increasing demands for functionality translate into higher signal speeds combined with an increasing number of input/outputs (I/Os). To limit the overall package size, the contact pad pitch of the components is reduced. The combination of a high number of I/Os with a reduced pitch places additional demands onto the PCB, requiring the use of laser-drilled microvias, high-aspect ratio core vias, and small track width and spacing. Although the associated advanced manufacturing processes have been widely used in commercial, automotive, medical, and military applications, reconciling these advancements in capability with the reliability requirements for space remains a challenge. Two categories of the HDI technology are considered: two levels of staggered microvias (basic HDI) and (up to) three levels of stacked microvias (complex HDI). In this article, the qualification of the basic HDI technology in accordance with ECSS-Q-ST-70-60C is described. At 1.0-mm pitch, the technology passes all testing successfully. At .8-mm pitch, failures are encountered during interconnection stress testing and conductive anodic filament testing. These failures provide the basis for updating the design rules for HDI PCBs.
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来源期刊
Journal of Microelectronics and Electronic Packaging
Journal of Microelectronics and Electronic Packaging Engineering-Electrical and Electronic Engineering
CiteScore
1.30
自引率
0.00%
发文量
5
期刊介绍: The International Microelectronics And Packaging Society (IMAPS) is the largest society dedicated to the advancement and growth of microelectronics and electronics packaging technologies through professional education. The Society’s portfolio of technologies is disseminated through symposia, conferences, workshops, professional development courses and other efforts. IMAPS currently has more than 4,000 members in the United States and more than 4,000 international members around the world.
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