Ag-Pd-Pt厚膜金属化SAC305焊点的力学性能和界面微观结构(二)——等温时效效应

P. Vianco, A. Kilgo, B. McKenzie, S. Williams, R. Ferrizz, Curtis Co
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引用次数: 0

摘要

记录了96.5Sn-3.0Ag-0.5Cu(wt.%,缩写SAC305)无铅焊料和氧化铝衬底上的Ag-Pd-Pt厚膜导体之间形成的焊点的性能和可靠性。Sheppard的钩拉试验用于评估焊点强度。第1部分的研究证实了焊点制造工艺具有较宽的工艺窗口。目前的研究确定,SAC305焊点在70–205°C的温度和5–200 d的时间内加速老化后保持了这种坚固性。5–10 d的短期老化导致拉伸强度峰值出现峰值,这是由Ag-Pd和(Pd,Pt)xSny金属间化合物(IMC)颗粒的沉淀硬化引起的。在70°C和100°C下经过较长的老化时间后,拉伸强度没有显著降低;这些条件是典型使用寿命的加速。当沉淀硬化机制因颗粒相的溶解及其在焊料/氧化铝界面的再沉淀而丧失时,在135–205°C的温度下较长的老化时间导致强度逐渐下降,尽管不是灾难性的。除最严重的老化条件外,焊料的失效模式为韧性断裂。这些发现证实了SAC305焊料/Ag-Pd-Pt厚膜互连对于混合微电路和高温电子应用具有优异的长期可靠性。
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Mechanical Properties and Interface Microstructure of SAC305 Solder Joints Made to a Ag-Pd-Pt Thick Film Metallization: Part 2—Isothermal Aging Effects
The performance and reliability were documented for solder joints made between the 96.5Sn-3.0Ag-0.5Cu (wt.%, abbreviated SAC305) Pb-free solder and a Ag-Pd-Pt thick film conductor on an alumina substrate. The Sheppard’s hook pull test was used to assess the solder joint strength. The Part 1 study confirmed that the solder joint fabrication process had a wide process window. The current study determined that the SAC305 solder joints maintained that robustness after accelerated aging at temperatures of 70–205°C and time durations of 5–200 d. Short-term aging of 5–10 d caused a peak in the pull strength peak that resulted from precipitation hardening by Ag-Pd and (Pd, Pt)xSny intermetallic compound (IMC) particles. The pull strengths did not decrease significantly after longer aging times at 70°C and 100°C; those conditions were accelerations of typical service lifetimes. Longer aging times at temperatures of 135–205°C resulted in a gradual, albeit not catastrophic, strength decrease when the precipitation hardening mechanism was lost to dissolution of the particle phases and their reprecipitation at the solder/alumina interface. The failure modes were ductile fracture in the solder except for the most severe aging conditions. These findings confirmed that the SAC305 solder/Ag-Pd-Pt thick film interconnections have excellent long-term reliability for hybrid microcircuit and high-temperature electronics applications.
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来源期刊
Journal of Microelectronics and Electronic Packaging
Journal of Microelectronics and Electronic Packaging Engineering-Electrical and Electronic Engineering
CiteScore
1.30
自引率
0.00%
发文量
5
期刊介绍: The International Microelectronics And Packaging Society (IMAPS) is the largest society dedicated to the advancement and growth of microelectronics and electronics packaging technologies through professional education. The Society’s portfolio of technologies is disseminated through symposia, conferences, workshops, professional development courses and other efforts. IMAPS currently has more than 4,000 members in the United States and more than 4,000 international members around the world.
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