一种利用TCB三维组装表征超低粘度NCF层的新方法

G. Capuz, M. Lofrano, C. Gerets, F. Duval, P. Bex, J. Derakhshandeh, K. Vanstreels, A. Phommahaxay, E. Beyne, Andy Miller
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引用次数: 0

摘要

对于高密度互连和细间距微凸块的芯片到晶片(D2W)堆叠,底部填充用于填充微凸块之间的空间,以实现保护和可靠性。在不同类型的底部填充物中,非导电膜(NCF)具有填角和体积控制的优点。然而,其中一个挑战是焊点润湿。NCF必须具有良好的嵌入通量激活,以减轻由于重复的TCB循环加速相邻裸片上的氧化而导致的Cu UBM焊盘氧化。NCF中的焊剂也有助于润湿焊料凸点。为了实现有效的焊料润湿,还必须了解NCF变形质量,这是其粘度的函数。该参数对焊点的变形有直接影响。高粘度的NCF将难以变形,从而在TCB回流温度期间防止焊料接触到焊盘。需要高的结合力,并且可能导致对准精度降低。对于低粘性NCF,它需要低结合力。焊点润湿是一个挑战,因为快速和瞬时变形会导致过度挤压。在本文中,我们试图展示一种创造性的NCF材料表征方法,考虑到NCF粘度、变形和焊料挤出等因素。我们使用TCB刀具位置跟踪数据来定义NCF的变形曲线,该曲线是TCB非常快剖面下温度和时间的函数。我们使用NCF粘度曲线作为与实际变形相关的参考,并预测了三种不同配置下的动态变形。在具有和不具有与刚性平板玻璃表面和底部Cu UBM焊盘结合的微凸块的芯片上执行变形测试配置。实验是在界面温度为~250°C的Sn以上靶回流下,用不同的加热斜坡速率进行的。作为验证,我们在具有20和40μm间距菊花链的测试车辆上应用了优化的TCB过程(力、温度和斜坡速率),并获得了良好的连接和良好的IMC形成。
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A Novel Method for Characterization of Ultralow Viscosity NCF Layers Using TCB for 3D Assembly
For die-to-wafer (D2W) stacking of high-density interconnects and fine-pitch microbumps, underfill serves to fill the spaces in-between microbumps for protection and reliability. Among the different types of underfill, nonconductive film (NCF) has the advantages of fillet and volume control. However, one of the challenges is the solder joint wetting. An NCF must have good embedded-flux activation to mitigate Cu UBM pad oxidation due to the repeated TCB cycles that accelerate oxidation on neighboring dice. The flux in the NCF also helps in wetting the solder bumps. To realize efficient solder wetting, one must also understand the NCF deformation quality, which is a function of its viscosity. This parameter has direct impact on the deformation of solder bumps. High-viscosity NCF would be difficult to deform, thus preventing solder contact to pad during TCB reflow temperature. High bond force is required and could lead to reduced alignment accuracy. For a low viscous NCF, it requires low bond force. Solder joint wetting is a challenge with excessive squeezeout due to fast and instantaneous deformation. We seek to demonstrate in this article a creative methodology for NCF material characterization, considering the factors of NCF viscosity, deformation, and solder squeezeout. We use TCB tool position-tracking data to define the deformation curve of the NCF as a function of temperature and time at very fast profile of TCB. We use the NCF viscosity curve as reference in relation to the actual deformation, and predict dynamic deformation in three different configurations. Deformation test configurations were performed on chips with and without microbumps bonded with a rigid flat glass surface and with a bottom Cu UBM pad. The experiments were performed with different heating ramp rates at target above Sn reflow of ~250°C interface temperature. As validation, we applied the optimized TCB process (force, temperature, and ramp rate) on a test vehicle with 20 and 40 μm pitch daisy chains and obtained very good connectivity with good joint and IMC formation.
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来源期刊
Journal of Microelectronics and Electronic Packaging
Journal of Microelectronics and Electronic Packaging Engineering-Electrical and Electronic Engineering
CiteScore
1.30
自引率
0.00%
发文量
5
期刊介绍: The International Microelectronics And Packaging Society (IMAPS) is the largest society dedicated to the advancement and growth of microelectronics and electronics packaging technologies through professional education. The Society’s portfolio of technologies is disseminated through symposia, conferences, workshops, professional development courses and other efforts. IMAPS currently has more than 4,000 members in the United States and more than 4,000 international members around the world.
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