基于数值模拟的虚拟样机优化设计确保电子组件装配和互连的热机械可靠性

IF 2.2 4区 工程技术 Q3 ENGINEERING, ELECTRICAL & ELECTRONIC Journal of Electronic Packaging Pub Date : 2022-12-13 DOI:10.1115/1.4056445
Ralf Dӧring, R. Dudek, S. Rzepka, L. Scheiter, E. Noack, B. Seiler
{"title":"基于数值模拟的虚拟样机优化设计确保电子组件装配和互连的热机械可靠性","authors":"Ralf Dӧring, R. Dudek, S. Rzepka, L. Scheiter, E. Noack, B. Seiler","doi":"10.1115/1.4056445","DOIUrl":null,"url":null,"abstract":"\n A methodology is presented that allows the evaluation of the thermomechanical reliability of electronic packages using ‘virtual prototyping’. Here, a virtual flip chip ball grid array (FC-BGA) is examined in compari-son to a reference chip scale package (CSP). The com-parison is performed using finite element (FE) simula-tion. A combined measurement-simulation technique is used to calibrate the finite element simulations on a reference object. The adjustment is based on the in-plane deformation field obtained by both simulation and opti-cal measurement. For the latter, an optical sensor is used for in-plane deformation and strain field analysis based on the gray-scale correlation method. The obtained find-ings can be extrapolated to alternative package types with different but similar design to evaluate their suita-bility for the desired application before physical fabrication.","PeriodicalId":15663,"journal":{"name":"Journal of Electronic Packaging","volume":" ","pages":""},"PeriodicalIF":2.2000,"publicationDate":"2022-12-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Design Optimization By Virtual Prototyping Using Numerical Simulation to Ensure Thermomechanical Reliability in the Assembly and Interconnection of Electronic Assemblies\",\"authors\":\"Ralf Dӧring, R. Dudek, S. Rzepka, L. Scheiter, E. Noack, B. Seiler\",\"doi\":\"10.1115/1.4056445\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\\n A methodology is presented that allows the evaluation of the thermomechanical reliability of electronic packages using ‘virtual prototyping’. Here, a virtual flip chip ball grid array (FC-BGA) is examined in compari-son to a reference chip scale package (CSP). The com-parison is performed using finite element (FE) simula-tion. A combined measurement-simulation technique is used to calibrate the finite element simulations on a reference object. The adjustment is based on the in-plane deformation field obtained by both simulation and opti-cal measurement. For the latter, an optical sensor is used for in-plane deformation and strain field analysis based on the gray-scale correlation method. The obtained find-ings can be extrapolated to alternative package types with different but similar design to evaluate their suita-bility for the desired application before physical fabrication.\",\"PeriodicalId\":15663,\"journal\":{\"name\":\"Journal of Electronic Packaging\",\"volume\":\" \",\"pages\":\"\"},\"PeriodicalIF\":2.2000,\"publicationDate\":\"2022-12-13\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Journal of Electronic Packaging\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://doi.org/10.1115/1.4056445\",\"RegionNum\":4,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q3\",\"JCRName\":\"ENGINEERING, ELECTRICAL & ELECTRONIC\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Electronic Packaging","FirstCategoryId":"5","ListUrlMain":"https://doi.org/10.1115/1.4056445","RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0

摘要

提出了一种方法,允许使用“虚拟原型”评估电子封装的热机械可靠性。这里,将虚拟倒装芯片球栅阵列(FC-BGA)与参考芯片级封装(CSP)进行比较。使用有限元模拟进行比较。使用组合测量模拟技术来校准参考对象上的有限元模拟。调整是基于通过模拟和光学测量获得的平面内变形场。对于后者,基于灰度相关方法,使用光学传感器进行平面内变形和应变场分析。所获得的发现可以外推到具有不同但相似设计的替代封装类型,以在物理制造之前评估其对所需应用的适用性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
Design Optimization By Virtual Prototyping Using Numerical Simulation to Ensure Thermomechanical Reliability in the Assembly and Interconnection of Electronic Assemblies
A methodology is presented that allows the evaluation of the thermomechanical reliability of electronic packages using ‘virtual prototyping’. Here, a virtual flip chip ball grid array (FC-BGA) is examined in compari-son to a reference chip scale package (CSP). The com-parison is performed using finite element (FE) simula-tion. A combined measurement-simulation technique is used to calibrate the finite element simulations on a reference object. The adjustment is based on the in-plane deformation field obtained by both simulation and opti-cal measurement. For the latter, an optical sensor is used for in-plane deformation and strain field analysis based on the gray-scale correlation method. The obtained find-ings can be extrapolated to alternative package types with different but similar design to evaluate their suita-bility for the desired application before physical fabrication.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
Journal of Electronic Packaging
Journal of Electronic Packaging 工程技术-工程:电子与电气
CiteScore
4.90
自引率
6.20%
发文量
44
审稿时长
3 months
期刊介绍: The Journal of Electronic Packaging publishes papers that use experimental and theoretical (analytical and computer-aided) methods, approaches, and techniques to address and solve various mechanical, materials, and reliability problems encountered in the analysis, design, manufacturing, testing, and operation of electronic and photonics components, devices, and systems. Scope: Microsystems packaging; Systems integration; Flexible electronics; Materials with nano structures and in general small scale systems.
期刊最新文献
Simultaneous Characterization of Both Ctes and Thermal Warpages of Flip-Chip Packages with a Cap Using Strain Gauges Research Status and Progress On Non-Destructive Testing Methods for Defect Inspection of Microelectronic Packaging Effects of Thermal-Moisture Coupled Field On Delamination Behavior of Electronic Packaging Heat Dissipation Design Based On Topology Optimization And Auxiliary Materials Optimal Design of Thermal Cycling Reliability For PBGA Assembly via FEM and Taguchi Method
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1