用于空间应用的具有改进写入能力的辐射硬化12T SRAM单元

Rishabh Sharma , Debabrata Mondal , Ambika Prasad Shah
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引用次数: 2

摘要

本文提出了一种用于空间辐射环境的具有增强写入能力的创新性且极为可靠的辐射硬化设计(RHBD)12T SRAM单元(RHWC-12T)。所提出的RHWC-12T SRAM是在Cadence Virtuoso上设计的,具有四个存储节点,并在供电电压为1.1V和工作温度为27℃的45nm CMOS技术中进行模拟。所提出的小区对0到1和1到0 SEU(单事件扰乱)都是容忍的。此外,与其他考虑的SRAM单元(如6T、10T Dohar、Quatro、We-Quatro、QUCCE-12T和NQuatro)相比,它提供了更好的速度和稳定性。根据仿真结果,所提出的SRAM单元提供了比10T Dohar SRAM单元更好的1.053倍的写入稳定性。此外,与10T Dohar SRAM单元相比,写访问时间提高了3.56倍,面积开销为1.36倍。
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Radiation hardened 12T SRAM cell with improved writing capability for space applications

This paper presents an inventive and extremely dependable radiation-hardened by-design (RHBD) 12T SRAM Cell with enhanced writing capability (RHWC-12T) for a space radiation environment. The Proposed RHWC-12T SRAM is designed on Cadence Virtuoso with quad-storage nodes and simulated in 45-nm CMOS technology with the supply voltage of 1.1 V and 27C operating temperature. The proposed cell is tolerant to both 0 to 1 and 1 to 0 SEUs (Single event upsets). Also, it provides better speed and stability compared to the other considered SRAM cells such as 6T, 10T Dohar, Quatro, We-Quatro, QUCCE-12T, and NQuatro. According to simulation findings, the proposed SRAM cell provides 1.053× better writing stability than the 10T Dohar SRAM cell. In addition, the write access time improves by 3.56× with 1.36× area overhead than 10T Dohar SRAM cell.

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