勘误:扫描和电子显微镜中的大数据和深度数据:从多维数据集派生功能

Alex Belianinov, Rama Vasudevan, Evgheni Strelcov, Anton Ievlev, Chad Steed, Sang Mo Yang, Alexander Tselev, Stephen Jesse, Michael Biegalski, Galen Shipman, Christopher Symons, Albina Borisevich, Rick Archibald, Sergei Kalinin
{"title":"勘误:扫描和电子显微镜中的大数据和深度数据:从多维数据集派生功能","authors":"Alex Belianinov, Rama Vasudevan, Evgheni Strelcov, Anton Ievlev, Chad Steed, Sang Mo Yang, Alexander Tselev, Stephen Jesse, Michael Biegalski, Galen Shipman, Christopher Symons, Albina Borisevich, Rick Archibald, Sergei Kalinin","doi":"10.1186/s40679-015-0011-9","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":460,"journal":{"name":"Advanced Structural and Chemical Imaging","volume":"1 1","pages":""},"PeriodicalIF":3.5600,"publicationDate":"2015-08-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1186/s40679-015-0011-9","citationCount":"16","resultStr":"{\"title\":\"Erratum: Big data and deep data in scanning and electron microscopies: deriving functionality from multidimensional data sets\",\"authors\":\"Alex Belianinov, Rama Vasudevan, Evgheni Strelcov, Anton Ievlev, Chad Steed, Sang Mo Yang, Alexander Tselev, Stephen Jesse, Michael Biegalski, Galen Shipman, Christopher Symons, Albina Borisevich, Rick Archibald, Sergei Kalinin\",\"doi\":\"10.1186/s40679-015-0011-9\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\",\"PeriodicalId\":460,\"journal\":{\"name\":\"Advanced Structural and Chemical Imaging\",\"volume\":\"1 1\",\"pages\":\"\"},\"PeriodicalIF\":3.5600,\"publicationDate\":\"2015-08-29\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"https://sci-hub-pdf.com/10.1186/s40679-015-0011-9\",\"citationCount\":\"16\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Advanced Structural and Chemical Imaging\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://link.springer.com/article/10.1186/s40679-015-0011-9\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q1\",\"JCRName\":\"Medicine\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Advanced Structural and Chemical Imaging","FirstCategoryId":"1085","ListUrlMain":"https://link.springer.com/article/10.1186/s40679-015-0011-9","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"Medicine","Score":null,"Total":0}
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Erratum: Big data and deep data in scanning and electron microscopies: deriving functionality from multidimensional data sets
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Advanced Structural and Chemical Imaging
Advanced Structural and Chemical Imaging Medicine-Radiology, Nuclear Medicine and Imaging
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