{"title":"定位千斤顶连接器中接触弹簧的优化设计","authors":"Kun-Nan Chen, Chia-Lin Wu, Hsien-Chie Cheng","doi":"10.1109/IMPACT.2009.5382236","DOIUrl":null,"url":null,"abstract":"Two basis designs of contact springs used in RJ-45 connectors with different layouts and beam thickness were sequentially examined and optimized. The first design failed to attain a feasible solution mainly due to insufficient beam thickness. The second one is simpler in layout and in pin geometry but with thicker pins. Optimum design for Type A and Type B pins based on the second was achieved efficiently using the RSM with the power-transformed response data of computed plastic strain and contact force. Both optimized models of Type A and Type B pins enjoy a reduced strain level and an elevated contact force level above a specified value of 12.5 gf.","PeriodicalId":6410,"journal":{"name":"2009 4th International Microsystems, Packaging, Assembly and Circuits Technology Conference","volume":"45 10","pages":"529-532"},"PeriodicalIF":0.0000,"publicationDate":"2009-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Optimum design of contact springs used in registered jack connectors\",\"authors\":\"Kun-Nan Chen, Chia-Lin Wu, Hsien-Chie Cheng\",\"doi\":\"10.1109/IMPACT.2009.5382236\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Two basis designs of contact springs used in RJ-45 connectors with different layouts and beam thickness were sequentially examined and optimized. The first design failed to attain a feasible solution mainly due to insufficient beam thickness. The second one is simpler in layout and in pin geometry but with thicker pins. Optimum design for Type A and Type B pins based on the second was achieved efficiently using the RSM with the power-transformed response data of computed plastic strain and contact force. Both optimized models of Type A and Type B pins enjoy a reduced strain level and an elevated contact force level above a specified value of 12.5 gf.\",\"PeriodicalId\":6410,\"journal\":{\"name\":\"2009 4th International Microsystems, Packaging, Assembly and Circuits Technology Conference\",\"volume\":\"45 10\",\"pages\":\"529-532\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2009-10-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2009 4th International Microsystems, Packaging, Assembly and Circuits Technology Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IMPACT.2009.5382236\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2009 4th International Microsystems, Packaging, Assembly and Circuits Technology Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IMPACT.2009.5382236","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Optimum design of contact springs used in registered jack connectors
Two basis designs of contact springs used in RJ-45 connectors with different layouts and beam thickness were sequentially examined and optimized. The first design failed to attain a feasible solution mainly due to insufficient beam thickness. The second one is simpler in layout and in pin geometry but with thicker pins. Optimum design for Type A and Type B pins based on the second was achieved efficiently using the RSM with the power-transformed response data of computed plastic strain and contact force. Both optimized models of Type A and Type B pins enjoy a reduced strain level and an elevated contact force level above a specified value of 12.5 gf.