CdTe生长温度和ZnTe:Cu接触条件对CdTe器件性能的影响

J. Burst, W. Rance, T. Barnes, M. Reese, J. Li, D. Kuciauskas, M. Steiner, T. Gessert, K. Zhang, C. T. Hamilton, K. Fuller, B. Aitken, C. K. Kosik Williams
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引用次数: 9

摘要

CdTe器件的性能在很大程度上取决于背触点的质量以及背触点在CdTe层本身引入铜掺杂的能力。铜掺杂ZnTe (ZnTe:Cu)由于其功功能和将铜源转化为CdTe的能力,是一种近乎理想的CdTe太阳能电池接触材料。过去的大多数ZnTe:Cu研究都是在相对较低的沉积温度(550°C及以下)下生长的CdTe。在这里,我们研究了在高达620°C的温度下使用ZnTe:Cu作为CdTe生长的背触点。我们观察到CdTe吸收剂沉积条件和优化的ZnTe:Cu接触条件之间有很强的相互作用。器件JV特性表明,高温(600 ~ 620℃)近空间升华(CSS)沉积吸收层的CdTe太阳能电池对Cu掺杂水平和接触温度的鲁棒性优于低温生长的CdTe太阳能电池。对工业过程的影响是在高温下将CdTe沉积在PV玻璃上的器件的器件效率绝对提高约1%。也许更重要的是,这种提高的性能保持在更大的温度窗口和ZnTe:Cu背接触的掺杂水平。对于在600°C沉积CdTe吸收剂的设备,对于含有2-5 wt.% Cu的背触点,以及接触温度范围为300-360°C的设备,设备效率保持在13.5%以上。红光偏置量子效率(QE)和电容电压(CV)测量用于探测引入铜掺杂谱和净受体密度的影响,以更好地了解ZnTe:Cu源如何影响最终的CdTe器件。
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The effect of CdTe growth temperature and ZnTe:Cu contacting conditions on CdTe device performance
CdTe device performance is strongly dependent on the quality of the back contact and the ability of the back contact to introduce a copper doping profile in the CdTe layer itself. Copper-doped ZnTe (ZnTe:Cu) is a nearly ideal contact material for CdTe solar cells due to its work function and ability to source copper to CdTe. Most of the ZnTe:Cu studies in the past used CdTe grown at relatively low deposition temperatures (550°C and below). Here we investigate the use of ZnTe:Cu as a back contact for CdTe grown at temperatures up to 620°C. We observe a strong interplay between the CdTe absorber deposition conditions and optimized ZnTe:Cu contacting conditions. Device JV characteristics suggest that CdTe solar cells with absorber layers deposited by close-space sublimation (CSS) at high temperature, 600-620°C, are more robust to the back contact Cu doping level and contacting temperature than CdTe grown at lower temperatures. The implication for industrial processes is a ~1% absolute increase in device efficiency for devices in which the CdTe is deposited on PV glass at high temperature. Perhaps more importantly, this increased performance is maintained for a larger window of temperature and doping level of the ZnTe:Cu back contact. For devices with CdTe absorbers deposited at 600°C, device efficiency in excess of 13.5% is maintained for back contacts containing 2-5 wt.% Cu, and for contacting temperatures ranging from 300-360°C. Red-light bias quantum efficiency (QE) and capacitance-voltage (CV) measurements are used to probe the effect of the introduced copper doping profiles and net acceptor density to better understand how ZnTe:Cu sources influences the resulting CdTe device.
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