多量子势垒界面电荷分布与激子特性的关系

T. Nee, Jen-Cheng Wang, H. Shen, Ya-Fen Wu
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引用次数: 0

摘要

在较宽的温度范围内研究了InGaN/GaN多量子阱发光二极管(led)的激子特性与异质界面电荷分布之间的独特相关性。从电流-电压分析中提取的非统一理想因子对温度的依赖关系决定了异质器件中的载流子输运机制。此外,载流子隧穿过程通过电荷分布的范围导致伪温度(To)和特征能(Eo)的异常增加,导致有效态密度较小时发光强度的异常恶化。与传统的氮化镓势垒器件相比,低铟MQB器件在各种温度范围内固有地表现出较小的to。在较高的温度下,每个样品都获得了与多层界面态特征能和电荷居数相关的小To。因此,高铟MQB系综比低铟MQB系综表现出相对较高的特征能量。发现InxGa1-xN/GaN多量子势垒led的特征能Eo随着InxGa1-xN/GaN mqb成分的增加而降低。相应的,随温度变化的电致发光观测表明,特征能量Eo异常导致光谱强度恶化。
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The dependence of excitonic characteristics on the interface charge distribution with multiquantum barrier
Unique correlations between the excitonic characteristics and hetero-interface charge distribution of InGaN/GaN multiple quantum well light-emitting diodes (LEDs) were investigated over a broad range of temperatures. The dependence of non-unity ideality factors extracted from the current-voltage analysis on temperature determines the carrier-transport mechanisms in the heterodevices. Furthermore, the carrier tunneling processes via the extent of the charge population consequently cause anomaly more pseudo-temperature (To) and further characteristic energy (Eo), result in the abnormal deterioration of the luminescence intensities with small effective density of state. With respect to conventional GaN barrier devices, low-indium MQB devices inherently exhibit a small To over a variety of temperature ranges. The small To associated with a small characteristic energy and charge population of the multilayer interface states is obtained for each sample at the higher temperature regime. Accordingly, the high-indium MQB ensemble manifests a relatively higher characteristic energy than does the low-indium MQB ensemble. The characteristic energy Eo for the LEDs with InxGa1-xN/GaN multiquantum barriers were found to be decreased as increased In composition of InxGa1-xN/GaN MQBs. Correspondingly, the temperature-dependent electroluminescence observations suggest that the characteristic energy Eo anomaly caused the spectral intensity to deteriorate.
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