电荷再分配SAR-ADC中基于电容失配的物理不可克隆函数

Qianying Tang, W. Choi, L. Everson, K. Parhi, C. Kim
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引用次数: 7

摘要

在65nm CMOS中演示了利用标准逐次逼近寄存器模拟-数字转换器(SAR-ADC)中的电容失配作为熵源的物理不可克隆函数(PUF)。sar - adc在许多片上系统中都很容易获得,这使得所提出的PUF的硬件开销几乎可以忽略不计。金属-氧化物-金属(MOM)电容器的固有工艺变化是通过电压比较器采样的电荷再分配操作来控制的。为了提高PUF输出的稳定性,采用了软响应生成和动态阈值技术。最后,我们验证了在较低的工作电压下执行注册操作可以确保PUF响应在身份验证期间使用的标称电源电压下稳定。
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A Physical Unclonable Function based on Capacitor Mismatch in a Charge-Redistribution SAR-ADC
A Physical Unclonable Function (PUF) using capacitor mismatch in a standard successive approximation register analog-to-digital converter (SAR-ADC) as the entropy source is demonstrated in 65nm CMOS. SAR-ADCs are readily available in many system-on-chips, making the hardware overhead of the proposed PUF almost negligible. The inherent process variation of metal-oxide-metal (MOM) capacitors is harnessed through a charge redistribution operation which is sampled by the voltage comparator. To enhance the stability of the PUF output, soft response generation and dynamic thresholding techniques were adopted. Finally, we verify that performing the enrollment operation at a lower operating voltage can ensure that PUF responses are stable at the nominal supply voltage used during authentication.
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